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Si and CdTe Detector Readout ASIC in 0.35µm CMOS for Energetic Electron Spectroscopy for Taranis Mission K.W. 1 Wong , O. 2 Bernal , 3 1 1 1 F. Bouyjou , G. Orttner , O. Chassela , M. Bassas , 1 1 1 P. Devoto , P.L. Blelly and J.A. Sauvaud G. 1 Roudil , H. 2 Tap , 1Institut de Recherche en Astrophysique et Planétologie of Centre National de la Recherche Scientifique, Toulouse France 2Laboratoire d’Analyse et d’Architecture des Systèmes of Centre National de la Recherche Scientifique and INP of Université de Toulouse, Toulouse France 3Service d’Electronique, des Détecteurs et d’Informatique, Gif-sur-Yvette Cedex F-91191, France Mission objective Layout considerations Taranis Mission objective is the study of lightings occurring above large storm clouds. These phenomena are called transient luminous events (TLEs). They are sometimes accompanied by terrestrial gamma-ray flashes (TGFs) as well as burst of precipitated and accelerated electrons. Their mechanisms and their effects are what the mission is trying to understand. IDEE ASIC objective Maximum detection 37 fC ENC Counting Rate Peaking time 2400 e600 kHz 60 ns Electronic Box Figure: Transistor Level Schematic of the AOP Figure: IDEE Sensor Radioactive source test 1088 e40kHz 3 µs The analog front end is followed by a peak detector and a SAR ADC. The SAR ADC is the same for both type of channel. Non detrimental overshoot CdTe data clock Si channel data clock Si channel data (extracted) Si 0 2,5 0,1 Si 1 Si 2 2 319keV Si 3 1,5 Si 4 1 0,5 0,01 0 0 0,001 0 10 20 30 40 bin (BCD) 50 60 Figure: 207Bi - (electron) and X source measurement on Si channels 10 70 20 30 40 bin (BCD) 50 60 70 Figure: 133Ba - (electron) and X source source measurement on Si channels SEE tests Test Facility: RADEF, JYFL, Jyvaskyla, Finland For SEL characterization, 2 samples were exposed with krypton ion and a tilt angle of 37 deg. for an effective LET of 40 MeV/(mg/cm²) at ambient temperature. CdTe data Si peak detector output Si channel data 482keV The SEL current is 91mA (versus 21mA nominal current). The delatch circuit (on board) has properly detected the latchup event. Simulation results Si Front end output 3 Si0 Si1 Si2 Si3 Si4 1 Count/sec The required integration time for CdTe channel being of 3µs, the signal undershoot is detrimental to the frequency performance of the channel. It is created by the 2nd pole of the CSA-PS chain. A PZC circuit is thus implemented by Figure: Simplified Schematic of CdTe Analog Front End adding an extra resistor Rz in parallel to the pulse shaper derivation circuit (Cd, Rd). CdTe channel performance The core circuit of the AOP is similar to the Minimum detection 6 fC one used for Si channels. ENC Counting Rate Peaking time The HV board generates the 100 and 300V necessary for Si and CdTe detectors biasing. The FPGA board encapsulates the detected energy in the appropriate data frame. The LVC board provides voltage supplies for the other boards. The detector head is made of 8 CdTe detectors placed behind a strip of 5 Silicon pixels. The centered Silicon pixel is about 40 times smaller than the others. It will be used alone during the South Atlantic Anomaly crossing that would saturate the instrument otherwise. HV, FPGA and LVC boards 10 160 fC ADC A 207Bi radioactive source has been placed in front of the detection head, centered in XY. The 207Bi 482keV - desintegration peak is detected on Si1 and Si3 channels (the closest to the source). A 976keV Beta- peak would be expected on the CdTe detector, but the Si detector placed between the source and the CdTe prevents having meaningful CdTe spectra. A 133Ba source has also been characterized showing the cluster of electron desintegration around 319keV. CdTe analog front end Maximum detection PD 5 Si channels count/sec 2 fC Analog FE IDEE ASIC is tested in the electronic box coupled with the detector head. Detection Head Minimum detection Peak Detect Interface Test Between ASIC and Detectors IDEE ASIC The Si detector front end makes use of a RC CSA followed by a semi gaussian shaper. The operational amplifier (AOP) core circuit is a two stage differential input/single ended output amplifier making use of a cascoded current mirror. The transistor size and biasing is optimized for noise and bandwidth performance. ADC PD Figure: Microphotograph of IDEE ASIC Si analog front end Si channel performance Analog FE To further reduce crosstalk, power supply of the analog part of the channel is isolated from the peak detection and ADC.. IDEE (Instrument Détecteur d’Electron Energétique) instrument is dedicated to energetic electron spectrometry in the range from 70keV to 4MeV. To achieve this goal, two types of detectors are used: Si detectors for the 70keV to 700keV energy range and CdTe detectors for the 300keV to 4MevVrange. The ASIC has the objective to digitize the energy response from 5 Si detectors and 8CdTe detectors with 6-bit resolution each. These 13 channels are integrated on the same chip. Figure: Simplified Schematic of Si Analog Front End 8 CdTe channels The circuit has been implemented in AMS 0.35µm HV CMOS technology. This technology has a triple well option allowing isolation of transistors from the bulk. => advantage in terms of noise and crosstalk reduction. CH1 (yellow) ASIC current (factor 30.3) CH2 (blue) Latchup Flag CH3 (pink) ASIC voltage supply CdTe peak detector output CdTe Front end output Acknowledgments The authors would like to thank Laurence Boissier from the french space agency CNES for her support.