Download Single Scan Mode (cont.)

Lecture 13 A/D Converter & D/A
Converter
Outline
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Basic Operation
Single Scan Mode
Continuous Scan Mode
Group Scan Mode
Interrupt Sources
Registers
D/A Converter
Overview
 The RX210 Group includes a 12-bit successive
approximation A/D converter
 Up to 16 channel analog inputs, temperature sensor outputs, or
internal reference voltages can be selected

Converter converts a maximum of 16 selected channels of analog
inputs, temperature sensor outputs, or internal reference voltages
into a 12-bit digital value through successive approximation
 The A/D converter has three operating modes
 Single scan mode

The analog inputs of up to 16 arbitrarily selected channels are
converted for only once in ascending channel order
 Continuous scan mode

The analog inputs of up to 16 arbitrarily selected channels are
continuously converted in ascending channel order
 Group scan mode

Up to 16 channels of the analog inputs are arbitrarily divided into
two groups and converted in ascending channel order in each group
Overview (cont.)

Group A and group B
 In group scan mode, the scan start conditions of group A and
group B can be independently selected

Allowing A/D conversion of group A and group B to be started
independently
 In double trigger mode

One arbitrarily selected analog input channel is converted in single
scan mode or group scan mode (group A)

The resulting data of A/D conversion started by the first and second
triggers are stored into separate registers

Duplication of A/D conversion data
 Self-diagnosis is executed once at the beginning of each
scan

One of the three voltages internally generated in the 12-bit A/D
converter is converted
 A/D conversion of the temperature sensor output or the
internal reference voltage is accomplished independently
Scanning Operation
 A/D conversion is performed sequentially on the analog
inputs of the specified channels
 In continuous scan mode, one or more specified channels are
scanned repeatedly

Until the ADST bit in ADCSR is cleared to 0 from 1 by software
 In group scan mode, the selected channels of group A and the
selected channels of group B are scanned once

After starting to be scanned according to the respective triggers
 In single scan mode and continuous scan mode, A/D conversion
is performed for ANn channels selected

By the ADANSA register, starting from the channel with the
smallest number n
 In group scan mode, A/D conversion is performed for ANn
channels of group A and group B selected

By the ADANSA and ADANSB registers, respectively, starting from
the channel with the smallest number n
Scanning Operation (cont.)
 When the temperature sensor output or the internal
reference voltage is selected
 Single scan mode should be used for A/D conversion
 Double trigger mode is to be used with single scan mode or
group scan mode
 A/D conversion data of a channel selected by the DBLANS[4:0]
bits in ADCSR is duplicated

Only if the conversion is started by any of the MTU or ELC (Event
Link Controller) triggers selected by TRSA[3:0] bits in ADSTRGR

ELC connects (links) the events generated by various peripheral
modules to different modules
 When any of AN000 to AN002 channels is set by the
SHANS[2:0] bits in ADSHCR
 The channel uses a channel-dedicated sample-and-hold circuit
 The set analog input is sampled and held before the first A/D
conversion of each scan
Single Scan Mode
 Basic operation with channel-dedicated sample-and-hold
circuits not used
 A/D conversion is performed once on the analog input of the
specified channels

Temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 A/D conversion is performed for ANn channels selected by the
ADANSA register

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software, synchronous trigger (MTU or ELC), or asynchronous
trigger input
 Each time A/D conversion of a single channel is completed

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)
 When A/D conversion of all the selected channels is completed

An S12ADI0 interrupt request is generated

If the ADIE bit in ADCSR is 1 (interrupt upon scanning completion)
Single Scan Mode (cont.)
 The ADST bit remains 1 (A/D conversion start) during A/D
conversion

Automatically cleared to 0 when A/D conversion of all the selected
channels is completed

The 12-bit A/D converter enters a wait state
Single Scan Mode (cont.)
 Basic operation with channel-dedicated sample-and-hold
circuits used
 Sample-and-hold operation is first performed
 Then A/D conversion is performed once on the analog input of
all the selected channels

The channels whose channel-dedicated sample-and-hold circuit is to
be used can be selected by SHANS[2:0] bits in ADSHCR

Temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 Analog input sampling of all the channels whose channeldedicated sample-and-hold circuit is to be used is started

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software, synchronous trigger (MTU or ELC), or asynchronous
trigger input
 After sample-and-hold operation, A/D conversion is performed
for ANn channels selected by the ADANSA register
Single Scan Mode (cont.)

Starting from the channel with the smallest number n
 Each time A/D conversion of a single channel is completed

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)
 When A/D conversion of all the selected channels is completed

An S12ADI0 interrupt request is generated

If the ADIE bit in ADCSR is 1 (interrupt upon scanning completion)
 The ADST bit remains 1 (A/D conversion start) during A/D
conversion

Automatically cleared to 0 when A/D conversion of all the selected
channels is completed

The 12-bit A/D converter enters a wait state
Single Scan Mode (cont.)
 Example of operation in single scan mode
 Channel-dedicated sample-and-hold circuits used
 Basic operation: AN000 to AN002 selected
Single Scan Mode (cont.)
 Channels selection and self-diagnosis (channel-dedicated
sample-and-hold circuits not used)
 A/D conversion is first performed for the self-diagnosis voltage

VREFH0 × 0, VREFH0 × 1/2, or VREFH0 × 1 generated from the
reference power supply voltage (VREFH0) supplied to the 12-bit
A/D converter
 A/D conversion is performed once on the analog input of the
selected channels

Temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 A/D conversion for self-diagnosis is first started

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software, synchronous trigger (MTU or ELC), or asynchronous
trigger input
 When A/D conversion for self-diagnosis is completed

The A/D conversion result is stored into the A/D self-diagnosis data
register (ADRD)
Single Scan Mode (cont.)
 A/D conversion is then performed for ANn channels selected by
the ADANSA register

Starting from the channel with the smallest number n
 Each time A/D conversion of a single channel is completed

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)
 When A/D conversion of all the selected channels is completed

An S12ADI0 interrupt request is generated if the ADIE bit in ADCSR
is 1 (S12ADI0 interrupt upon scanning completion enabled)
 The ADST bit remains 1 (A/D conversion start) during
conversion

Automatically cleared to 0 when A/D conversion of all the selected
channels is completed

The 12-bit A/D converter enters a wait state
Single Scan Mode (cont.)
 Example of operation in single scan mode
 Basic operation + self-diagnosis
Single Scan Mode (cont.)
 Channels selection and self-diagnosis (channel-dedicated
sample-and-hold circuits used)
 Sample-and-hold operation is first performed
 A/D conversion is performed once for the self-diagnosis voltage

VREFH0 × 0, VREFH0 × 1/2, or VREFH0 × 1 generated from the
reference power supply voltage (VREFH0) supplied to the 12-bit
A/D converter
 A/D conversion is performed only once on the analog input of
the selected channels

Temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 Analog input sampling of all the channels whose channeldedicated sample-and-hold circuit is to be used is started

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software, synchronous trigger (MTU or ELC), or asynchronous
trigger input
Single Scan Mode (cont.)
 After sample-and-hold operation, A/D conversion for selfdiagnosis is started
 When A/D conversion for self-diagnosis is completed

The A/D conversion result is stored into the A/D self-diagnosis data
register (ADRD)
 A/D conversion is then performed for ANn channels selected by
the ADANSA register

Starting from the channel with the smallest number n
 Each time A/D conversion of a single channel is completed

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)
 When A/D conversion of all the selected channels is completed

An S12ADI0 interrupt request is generated if the ADIE bit in ADCSR
is 1 (S12ADI0 interrupt upon scanning completion enabled)
 The ADST bit remains 1 during A/D conversion

Automatically cleared to 0 as conversion of all channels is finished

Then the 12-bit A/D converter enters a wait state
Single Scan Mode (cont.)
 Example of operation in single scan mode
 Channel-dedicated sample-and-hold circuits used + selfdiagnosis
Single Scan Mode (cont.)
 A/D conversion of the temperature sensor output
 Should be performed in single scan mode
 All the channels should be deselected

Set the ANSA[15:0] bits in ADANSA to 0000h and DBLE bit in
ADCSR to 0
 Self-diagnosis should be deselected

The internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should also be set to 0 (non-selection)
 A/D conversion is started for the temperature sensor output

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
the trigger from the temperature sensor
 When A/D conversion is completed

The A/D conversion result is stored into the A/D temperature
sensor data register (ADTSDR)

If the ADIE bit in ADCSR is 1 (S12ADI0 interrupt upon scanning
completion enabled), an S12ADI0 interrupt request is generated
 The ADST bit remains 1 during A/D conversion
Single Scan Mode (cont.)

Automatically cleared to 0 when A/D conversion is completed

Then the 12-bit A/D converter enters a wait state
Single Scan Mode (cont.)
 A/D conversion of the internal reference voltage
 Should be performed in single scan mode
 All the channels should be deselected

Set the ANSA[15:0] bits in ADANSA to 0000h and DBLE bit in
ADCSR to 0
 Self-diagnosis should be deselected

The temperature sensor output A/D conversion select bit (TSS) in
ADEXICR should also be set to 0 (non-selection)
 A/D conversion is started for the internal reference voltage

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software, the synchronous trigger (MTU or ELC), or the
asynchronous trigger input
 When A/D conversion is completed

The A/D conversion result is stored into the A/D internal reference
voltage data register (ADOCDR)

If the ADIE bit in ADCSR is 1 (S12ADI0 interrupt upon scanning
completion enabled), an S12ADI0 interrupt request is generated
Single Scan Mode (cont.)
 The ADST bit remains 1 during A/D conversion

Automatically cleared to 0 when A/D conversion is completed

Then the 12-bit A/D converter enters a wait state
Single Scan Mode (cont.)
 In single scan mode with double trigger mode
 Single scan operation started by the MTU or ELC trigger is
performed twice
 Self-diagnosis should be deselected

The temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 Duplication of A/D conversion data is enabled

By setting the channel numbers to be duplicated to the
DBLANS[4:0] bits in ADCSR

Setting the DBLE bit in ADCSR to 1

When the DBLE bit in ADCSR is set to 1, channel selection using the
ADANSA register is invalid
 MTU or ELC triggers should be selected using the TRSA[3:0]
bits in ADSTRGR

The EXTRG bit and TRGE bit in ADCSR should be set to 0 and 1,
respectively

Software trigger should not be used
Single Scan Mode (cont.)
 A/D conversion is started on the single channel selected by the
DBLANS[4:0] bits in ADCSR

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
the MTU or ELC trigger input
 When A/D conversion is completed

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)

The ADST bit is automatically cleared to 0

The 12-bit A/D converter enters a wait state

An S12ADI0 interrupt request is not generated irrespective of the
ADIE (interrupt upon scanning completion) bit setting in ADCSR
 When the ADST bit in ADCSR is set to 1 (A/D conversion start)
by the second trigger input

A/D conversion is started on the single channel selected by the
DBLANS[4:0] bits in ADCSR
 When A/D conversion is completed

The A/D conversion result is stored into the A/D data duplication
register (ADDBLDR)
Single Scan Mode (cont.)

Exclusively used in double trigger mode

If the ADIE bit in ADCSR is 1, an interrupt request is generated
 The ADST bit remains 1 (A/D conversion start) during A/D
conversion

Automatically cleared to 0 when A/D conversion is completed

Then the 12-bit A/D converter enters a wait state
Continuous Scan Mode
 A/D conversion is performed repeatedly on the analog input
of the specified channel
 The temperature sensor output A/D conversion select bit (TSS)
and internal reference voltage A/D conversion select bit (OCS)
in ADEXICR should both be set to 0 (non-selection)
 The 12-bit A/D converter sequentially starts A/D conversion for
ANn channels selected by the ADANSA register

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software, synchronous trigger (MTU or ELC), or asynchronous
trigger input

Starting from the channel with the smallest number n
 Each time A/D conversion of a single channel is completed

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)
 When A/D conversion of all the selected channels is completed

An S12ADI0 interrupt request is generated if the ADIE bit in ADCSR
is 1 (S12ADI0 interrupt upon scanning completion enabled)
Continuous Scan Mode (cont.)
 The ADST bit in ADCSR is not automatically cleared to 0

The above steps 2 and 3 are repeated as long as the bit remains 1
(A/D conversion start)

When the ADST bit in ADCSR is set to 0 (A/D conversion stop), A/D
conversion stops

The 12-bit A/D converter enters a wait state
 When the ADST bit is later set to 1 (A/D conversion start)

A/D conversion is started again for ANn channels selected by the
ADANSA register

Starting from the channel with the smallest number n
Continuous Scan Mode (cont.)
 Example of operation in continuous scan mode
 Basic operation: AN000 to AN002 selected
Continuous Scan Mode (cont.)
 When the channel-dedicated sample-and-hold circuit is used
 Sample-and-hold operation is first performed
 Then A/D conversion is repeated on the analog input of all the
selected channels

The channels whose channel-dedicated sample-and-hold circuit is to
be used can be selected by the SHANS[2:0] bits in ADSHCR

Temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 Analog input sampling of all the channels whose channeldedicated sample-and-hold circuit is to be used is started

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software or synchronous trigger (MTU or ELC) input
 After sample-and-hold operation, A/D conversion is performed
for ANn channels selected by the ADANSA register

Starting from the channel with the smallest number n
 Each time A/D conversion of a single channel is completed
Continuous Scan Mode (cont.)

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)
 When A/D conversion of all the selected channels is completed

An S12ADI0 interrupt request is generated if the ADIE bit in ADCSR
is 1 (S12ADI0 interrupt upon scanning completion enabled)
 At the same time, analog input sampling is started for all the
channels whose channel-dedicated sample-and-hold circuit is to
be used
 The ADST bit is not automatically cleared to 0

The above steps are repeated as long as the bit remains 1
 When the ADST bit is set to 0 (A/D conversion stop)
 A/D conversion stops
 The 12-bit A/D converter enters a wait state
 When the ADST bit is later set to 1 (A/D conversion start)

Analog input sampling is started again for all the channels whose
channel-dedicated sample-and-hold circuit is to be used
Continuous Scan Mode (cont.)
 Example of operation in continuous scan mode
 Channel-dedicated sample-and-hold circuit is used
Continuous Scan Mode (cont.)
 Channels selection and self-diagnosis
 A/D conversion is first performed for the self-diagnosis voltage

VREFH0 × 0, VREFH0 × 1/2, or VREFH0 × 1 generated from the
reference power supply voltage (VREFH0) supplied to the 12-bit
A/D converter
 Then A/D conversion is performed on the analog input of the
selected channels

The temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 A/D conversion for self-diagnosis is first started

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software, synchronous trigger (MTU or ELC), or asynchronous
trigger input
 When A/D conversion for self-diagnosis is completed

The A/D conversion result is stored into the A/D self-diagnosis data
register (ADRD)
Continuous Scan Mode (cont.)
 A/D conversion is then performed for ANn channels selected by
the ADANSA register

Starting from the channel with the smallest number n
 Each time A/D conversion of a single channel is completed

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)
 When A/D conversion of all the selected channels is completed

An S12ADI0 interrupt request is generated if the ADIE bit in ADCSR
is 1 (S12ADI0 interrupt upon scanning completion enabled)

At the same time, the 12-bit A/D converter starts A/D conversion
for self-diagnosis

Then starts A/D conversion on ANn channels selected by the
ADANSA register
 The ADST bit is not automatically cleared to 0

The above steps are repeated as long as the bit remains 1

When the ADST bit is set to 0 (A/D conversion stop), A/D
conversion stops

The 12-bit A/D converter enters a wait state
Continuous Scan Mode (cont.)
 When the ADST bit is later set to 1 (A/D conversion start)

The A/D conversion for self-diagnosis is started again
 Example of operation in continuous scan mode
 Basic operation + self-diagnosis
Continuous Scan Mode (cont.)
 Channels selection and self-diagnosis and self-diagnosis
 Sample-and-hold operation is first performed
 Then A/D conversion is performed for the self-diagnosis voltage

VREFH0 × 0, VREFH0 × 1/2, or VREFH0 × 1 generated from the
reference power supply voltage (VREFH0) supplied to the 12-bit
A/D converter
 After that, A/D conversion is performed on the analog input of
the selected channels

Temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 Analog input sampling of all the channels whose channeldedicated sample-and-hold circuit is to be used is started

When the ADST bit in ADCSR is set to 1 (A/D conversion start) by
software, synchronous trigger (MTU or ELC), or asynchronous
trigger input
 After sample-and-hold operation, A/D conversion for selfdiagnosis is started
Continuous Scan Mode (cont.)
 When A/D conversion for self-diagnosis is completed

The A/D conversion result is stored into the A/D self-diagnosis data
register (ADRD)
 A/D conversion is then performed for ANn channels selected by
the ADANSA register

Starting from the channel with the smallest number n
 Each time A/D conversion of a single channel is completed

The A/D conversion result is stored into the corresponding A/D data
register (ADDRy)
 When A/D conversion of all the selected channels is completed

An S12ADI0 interrupt request is generated if the ADIE bit in ADCSR
is 1 (S12ADI0 interrupt upon scanning completion enabled)
 At the same time, analog input sampling is started for all the
channels whose channel-dedicated sample-and-hold circuit is to
be used
 The ADST bit is not automatically cleared to 0

The above steps are repeated as long as the bit remains 1
Continuous Scan Mode (cont.)
 When the ADST bit is set to 0 (A/D conversion stop)

A/D conversion stops

The 12-bit A/D converter enters a wait state
 When the ADST bit is later set to 1 (A/D conversion start)

Analog input sampling is started again for all the channels whose
channel-dedicated sample-and-hold circuit is to be used
 Example of operation in continuous scan mode
 Channel-dedicated sample-and-hold circuit + self-diagnosis
Group Scan Mode
 A/D conversion is performed once on the analog inputs of all
the specified channels in group A and group B
 After scanning is started by the MTU or ELC trigger
 Scan operation of each group is similar to the scan operation in
single scan mode
 The group A trigger and group B trigger can be selected using
the TRSA[3:0] and TRSB[3:0] bits in ADSTRGR, respectively

The different triggers should be used for group A and group B to
prevent simultaneous A/D conversion of group A and group B

Software trigger should not be used
 The group A and group B channels to be converted are selected
using the ADANSA register and ADANSB register, respectively

Group A and group B cannot use the same channels

The temperature sensor output A/D conversion select bit (TSS) and
internal reference voltage A/D conversion select bit (OCS) in
ADEXICR should both be set to 0 (non-selection)
 When self-diagnosis is selected in group scan mode
Group Scan Mode (cont.)

Self-diagnosis is separately executed for group A and group B
 An operation in group scan mode using a trigger from the MTU
 Scanning of group A is started by the TRG4AN trigger from MTU
 When group A scanning is completed

An S12ADI0 interrupt is output if the ADIE bit in ADCSR is 1
 Scanning of group B is started by the TRG4BN trigger from MTU
 When group B scanning is completed

A GBADI interrupt is output if the GBADIE bit in ADCSR is 1
Group Scan Mode (cont.)
 In group scan mode with double trigger mode
 Single scan operation started by the MTU or ELC trigger is
performed twice for group A
 For group B, single scan operation started by the MTU or ELC
trigger is performed once

The group A trigger and group B trigger can be selected using the
TRSA[3:0] and TRSB[3:0] bits in ADSTRGR, respectively

The different triggers should be used for group A and group B to
prevent simultaneous A/D conversion of group A and group B

Software trigger, synchronous trigger (temperature sensor), or
asynchronous trigger (ADTRG0#) should not be used

The group A and group B channels to be A/D-converted are
selected using the DBLANS[4:0] bits in ADCSR register and
ADANSB register, respectively

The same channels cannot be selected for both groups

In group scan mode, the temperature sensor output A/D conversion
select bit (TSS) and internal reference voltage A/D conversion
select bit (OCS) in ADEXICR should both be set to 0 (non-selection)
Group Scan Mode (cont.)
 Self-diagnosis cannot be selected
 Duplication of A/D conversion data is enabled

By setting the channel numbers to be duplicated to the
DBLANS[4:0] bits in ADCSR and setting the DBLE bit in ADCSR to 1
 An operation in group scan mode with double trigger mode
using a trigger from the MTU
 Scanning of group B is started by the TRG0AN trigger from MTU
 When group B scanning is completed

A GBADI interrupt is output if the GBADIE bit in ADCSR is 1
 The first scanning of group A is started by the first TRG4ABN
trigger from the MTU
 When the first scanning of group A is completed

The conversion result is stored into ADDRy

An S12ADI0 interrupt request is not generated irrespective of the
ADIE bit setting in ADCSR
 The second scanning of group A is started by the second
TRG4ABN trigger from the MTU
Group Scan Mode (cont.)
 When the second scanning of group A is completed

The conversion result is stored into ADDBLDR

An S12ADI0 interrupt is output if the ADIE bit is 1
Automatic Register Clearing Function
 Setting the ACE bit in ADCER to 1 automatically clears the
A/D data registers to 0000h
 When the A/D data registers are read by the CPU, DTC, or
DMAC

ADDRy, ADRD, ADTSDR, and ADOCDR
 Enables detection of update failures of the A/D data registers
 An examples in which the function to automatically clear the
ADDRy register is enabled and disabled
 When the ACE bit in ADCER is 0 (automatic clearing is disabled)

If the A/D conversion result (0222h) is not written to the ADDRy
register for some reason

The old data (0111h) will be the ADDRy value
 If this ADDRy value is written to a general register using an
A/D scan end interrupt

The old data (0111h) can be saved in the general register
 When checking whether there is an update failure
Automatic Register Clearing Function (cont.)

It is necessary to frequently save the old data in the RAM or a
general register
 When the ACE bit in ADCER is 1 (automatic clearing is enabled)

If ADDRy = 0111h is read by the CPU, DTC, or DMAC, ADDRy is
automatically cleared to 0000h
 If the new A/D conversion result 0222h cannot be transferred
to ADDRy for some reason

The cleared data (0000h) remains as the ADDRy value
 If this ADDRy value is read into a general register using an A/D
scan end interrupt at this point

0000h will be saved in the general register
 Occurrence of an ADDRy update failure can be determined by
simply checking that the read data value is 0000h
A/D-Converted Value Addition Function
 The same channel is A/D converted two to four consecutive
times
 The sum of the converted values is stored in the data
register
 The use of the average of these results can improve the
accuracy of A/D conversion

Depending on the types of noise components that are present
 Cannot always guarantee an improvement in A/D conversion
accuracy
 A/D-converted value addition function can be used

For channel-selected analog input A/D conversion and internal
reference voltage A/D conversion
Asynchronous Triggers
 The A/D conversion can be started by the input of an
asynchronous trigge
 The A/D conversion start trigger select bits
(ADSTRGR.TRSA[3:0]) should be set to 0000b
 A high-level signal should be input to the asynchronous trigger

ADTRG0# pin
 The ADCSR.TRGE and ADCSR.EXTRG bits should be set to 1
Synchronous Triggers
 The A/D conversion can be started by a synchronous trigger
of the MTU, TPU, ELC, or temperature sensor
 The ADCSR.TRGE bit should be set to 1
 The ADCSR.EXTRG bit should be cleared to 0
 The relevant source should be selected by ADSTRGR.TRSA[3:0]
and TRSB[3:0] bits
 When the temperature sensor output is converted
 A trigger from the temperature sensor should be used to start
the A/D conversion
 A trigger from the temperature sensor cannot be used when an
analog input channel or the internal reference voltage is
converted
Interrupt Sources
 The 12-bit A/D converter can send scan end interrupt
requests S12ADI0 and GBADI to the CPU
 Setting the ADIE bit in ADCSR to 1 and 0 enables and disables
an S12ADI0 interrupt, respectively
 Setting the GBADIE bit in ADCSR to 1 and 0 enables and
disables a GBADI interrupt, respectively
 The DTC or DMAC can be started up when an S12ADI0 or a
GBADI interrupt is generated

Using an interrupt to allow the DTC or DMAC to read the converted
data enables continuous conversion without burden on software
 The ELC connects the S12ADI0 interrupt request signal to
the predetermined module as the event signal
 i.e., event linkage
 The GBADI interrupt request cannot be used as the event signal
 The event signal can be output

Irrespective of the setting of the corresponding interrupt request
enable bit
Interrupt Sources (cont.)
 The 12-bit A/D converter outputs the A/D conversion end event
 The 12-bit A/D converter can be started by the
predetermined event by setting ELSRn of the ELC
 When an event occurs during A/D conversion, it is invalid
Registers
 A/D Control Register (ADCSR)
Registers (cont.)
 A/D Control Extended Register (ADCER)
Registers (cont.)
 A/D Channel Select Register A (ADANSA)
 A/D Channel Select Register B (ADANSB)
Registers (cont.)
 A/D Sample and Hold Circuit Control Register (ADSHCR)
Registers (cont.)
 A/D Conversion Extended Input Control Register (ADEXICR)
Registers (cont.)
 A/D Data Registers y (ADDRy) (y = 0 to 15)
 ADCER.ADRFMT = 0 (Setting for right-alignment)
 ADCER.ADRFMT = 1 (Setting for left-alignment)
 When A/D-converted value addition mode is selected
Registers (cont.)
 A/D Data Duplication Register (ADDBLDR)
 ADDBLDR ADCER.ADRFMT = 0 (Setting for right-alignment)
 ADCER.ADRFMT = 1 (Setting for left-alignment)
 When A/D-converted value addition mode is selected
Registers (cont.)
 A/D Self-Diagnosis Data Register (ADRD)
 ADCER.ADRFMT = 0 (Setting for right-alignment)
 ADCER.ADRFMT = 1 (Setting for left-alignment)
Registers (cont.)
 A/D Temperature Sensor Data Register (ADTSDR)
 ADCER.ADRFMT = 0 (Setting for right-alignment)
 ADCER.ADRFMT = 1 (Setting for left-alignment)
Registers (cont.)
 A/D Internal Reference Voltage Data Register (ADOCDR)
 ADCER.ADRFMT = 0 (Setting for right-alignment)
 ADCER.ADRFMT = 1 (Setting for left-alignment)
Registers (cont.)
 A/D Start Trigger Select Register (ADSTRGR)
D/A Converter
 The specifications of the D/A converter
 Resolution: 10 bits
 Output channels: Two channels
 Low power consumption function:

Module stop state can be set for each unit
 Event link function (input)

D/A0 conversion can be started when an event signal is input
 Pin Configuration of D/A Converter
D/A Converter (cont.)
Operation
 The D/A converter includes D/A conversion circuits for two
channels
 Each of which can operate independently
 D/A converter is enabled and the conversion result is output

When the DAOEi bit (i = 0, 1) in DACR is set to 1
 An operation example of D/A conversion on channel 0
 Write the data for conversion to DADR0
 Set the DAOE0 bit in DACR to 1 to start D/A conversion

The conversion result is output from the analog output pin DA0
after the conversion time tDCONV has elapsed

The conversion result continues to be output until DADR0 is written
to again

Or the DAOE0 bit is cleared to 0
 The output value is expressed by the following formula:
Operation (cont.)
 If DADR0 is written to again, the conversion is immediately
started

The conversion result is output after the conversion time tDCONV
has elapsed
 If the DAOE0 bit is cleared to 0, analog output is disabled
Registers
 D/A Data Register m (DADRm) (m = 0, 1)
 DADRm Format Select Register (DADPR)
Registers (cont.)
 D/A Control Register (DACR)