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SCANNINGELECTRONMICROSCOPE(SEM) EMLabprovidesonescanningelectronmicroscopes(SEM). Scanningmicroscopecanbeusedinbothhigh‐andlow‐vacuummode.Inlow‐vaccum modethesamplemaycontainwaterandnometalcoating. Modell/type:JEOLJSM6480 Acquiredin2005 Filament:Tungsten Acceleratingvoltages:upto30kV Imagingmodes:HV,LV Resolution:3,5nm Magnifications:upto300.000x Imagecapture:camera(2560x1920x8bit) Detectors:SEI,BSE Software:Scandium