Download OXFORD MATERIALS CHARACTERISATION SERVICE

Survey
yes no Was this document useful for you?
   Thank you for your participation!

* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project

page
1
page
2
Document related concepts
no text concepts found
Transcript 
OXFORD MATERIALS
CHARACTERISATION
SERVICE
MATERIALS ANALYSIS
DATA PROVISION
CONSULTANCY
COLLABORATION
IN-HOUSE TRAINING
PARTICLE ANALYSIS
BULK ANALYSIS
SURFACE ANALYSIS
MATERIALS PROCESSING
OXFORD MATERIALS
CHARACTERISATION
SERVICE
Examples of facilities available include:
 Optical microscopy
 Optical spectroscopy (UV/visible/NIR, imaging FTIR, imaging
Raman)
 Profilometry (optical, contact stylus) and scanning probe
microscopy










Micro and nano mechanical measurements
Thermal analysis (TGA and H-DSC)
BET surface area determination
Particle sizing and zeta potential measurements
Electron microscopy and microanalysis
Surface analysis (XPS)
SIMS imaging and depth profiling
X-ray diffraction
Thin film and bulk XRF
Comprehensive range of sample preparation facilities,
including wet/dry processing, FIB, etc.
 Polymer, metal, semiconductor, superconductor processing
facilities.
Further details available at:
http://www-omcs.materials.ox.ac.uk/
Contact Details:
Department of Materials, Oxford University,
Begbroke Science Park, Begbroke Hill,
Woodstock Road,
Oxford, OX5 1PF.
T +44(0)1865 283726
F +44(0)1865 848790
[email protected]
OMCS provides services on behalf of Oxford University
Department of Materials, Parks Rd, Oxford OX1 3PH
T 01865 273700 F 01865 273789
Related documents