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Europaisches Patentamt (19) J | | | | 1 1| | | | | | | 1 1| | | 1 1 | | | || | | European Patent Office Office europeen des brevets (11) EP 0 775 917 A3 E U R O P E A N PATENT A P P L I C A T I O N (12) ation A3: (88) Date of publication 08.10.1997 Bulletin 1997/41 (51) |nt. CI.6: G01 R 3 3 / 0 3 5 (43) Date of publication A2: 28.05.1997 Bulletin 1997/22 (21) Application number: 96116260.9 (22) Date of filing: 10.10.1996 (84) Designated Contracting States: DE GB (30) Priority: 22.11.1995 JP 304782/95 (71 ) Applicant: SEIKO INSTRUMENTS INC. Chiba-shi, Chiba 261 (JP) (72) Inventors: • Chinone, Kazuo Mihama-ku, Chiba-shi, Chiba 261 (JP) (54) CO < • Nakayama, Satoshi Mihama-ku, Chiba-shi, Chiba 261 (JP) • Morooka, Toshimitsu Mihama-ku, Chiba-shi, Chiba 261 (JP) • Odawara, Akikazu Mihama-ku, Chiba-shi, Chiba 261 (JP) (74) Representative: Fleuchaus, Leo, Dipl.-lng. et al Melchiorstrasse 42 81479 Munchen (DE) Superconducting quantum interference device f luxmeter and nondestructive inspection apparatus An inspection apparatus having a compact (57) configuration is provided in a SQUID flux meter used for nondestructive inspection to make inspection for defects, corrosion, etc. of metal in a nondestructive and non-contact mode. A SQUID 1, comprising two Josephson junctions 3, a washer coil 4, shunt resistors 5, a damping resistor 6, and a feedback modulation coil 8, is formed of a superconducting thin film on a substrate 14. A magnetic field applying coil 9 is formed on the same substrate 14 with a superconducting thin film or a normal conducting metal thin film. The magnetic field applying coil 9, which is wound plural turns around the SQUID 1, applies a dc or ac magnetic field for inspection to a sample. The change in magnetic field produced by a defect in the sample is detected directly by the washer coil 4, by which the position and size of the defect are inspected. Since the magnetic field applying coil is integrated on the same substrate as that on which the SQUID is formed, an increase in the scale of the apparatus can be restrained, providing a simple construction. cr> 10 r»o Q_ LU Printed by Rank Xerox (UK)Business Services 2.14.15/3.4 F I G. 1 6 5 EP 0 775 917 A3 European Patent office ^"t^ ^ EP 96 11 6260 EUROPEAN SEARCH REPORT DOCUMENTS CONSIDERED TO BE RELEVANT Citation of document with indication, where appropriate, Relevant Category of relevant passages to claim KETCHEN M ET AL: "OCTAGONAL WASHER DE SQUIDS AND INTEGRATED SUSCEPTOMETERS FABRICATED IN A PLANARIZED SUB- M NB-ALOX-NB TECHNOLOGY" IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, vol. 3, no. 1, PART 04, 1 March 1993, pages 1795-1799, XP000518105 * page 1795, right-hand column, line 5 page 1796, left-hand column, line 2 * 1,4,5 US 4 588 947 A (KETCHEN MARK B) 13 May 1986 * column 4, line 1 - line 34; figure 1 * 1,4,5 US 5 293 119 A (PODNEY WALTER N) 8 March 1994 * column 2, line 28 - line 47 * 1,5 A EP 0 591 641 A (SEIKO INSTR CO LTD) 13 April 1994 A EP 0 399 499 A (HITACHI LTD) 28 November 1990 A US 5 218 297 A (NAKANE HIDEAKI June 1993 G01R33/035 TECHNICAL FIELDS SEARCHED (Int.CI.6) G01R G01N ET AL) 8 The present search report has been drawn up for all claims Place ofsearch Dateof completion of the search THE HAGUE 8 August 1997 CATEGORY OF CITED DOCUMENTS X: particularly relevant if taken alone Y: particularly relevant if combined with another document of the same category A: technological background O: non-written disclosure P : intermediate document CLASSIFICATION OF THE APPLICATION (lnt.CI.6) Examiner Swart jes, H T : theory or principle underlying the invention E : earlier patent document, but published on, or after the filing date D: document cited in the application L: document cited for other reasons &: member of the same patent family, corresponding document 2