Download B.Tech. 2nd Year ECE Branch Syllabus

TABLE OF CONTENTS
S. No. Topic
Page No.
1.
New Study Evaluation Scheme (Year-II, Semester-III) ….....……….……….
3
2.
New Study Evaluation Scheme (Year-II, Semester-IV) ..….…………………
4
3.
EAS-301/EAS-401: Mathematics-III ………..…………………………..……...
5
4.
EEC-301: Fundamentals of Electronics Devices ….………………….….…..
5
5.
EEC-302: Digital Electronics …………..………………………………….……. 6
6.
EEC-303: Electromagnetic Field Theory ……………………………….……... 7
7.
EEC-304: Fundamental of Network Analysis & Synthesis ….………….……
8.
EEC-351: Electronics Engineering Lab – I ……………………………………. 8
9.
EEC-352: Digital Electronics Lab - I ………….……………….………….……. 9
10.
EEC-353: Electronic Workshop & PCB Lab ………………..……………….... 9
11.
EEC-401: Electronics Circuits …………..………………………………….…... 9
12.
EEC-402: Computer Architecture and Organization ………………………..... 10
13.
EEC-403: Electronic Instrumentation & Measurements ……………………... 10
14.
EEC-404: Signals and Systems ………………………………………….......... 11
15.
EEC-451: Electronics Engineering Lab - II ….….…………………………...... 12
16.
EEC-452: Digital Lab - II ………………………………………………………… 12
17.
EEC-453: Measurement Lab ………………………………………………….… 12
18.
List of Science Based Open Elective ……………….……………………….…. 13
19.
EOE-031/EOE-041: Introduction to Soft Computing ……..………………….. 14
20.
EOE-032/EOE-042: Nano Sciences ………………………..……………….…. 14
21.
EOE-033/EOE-043: Laser System and Applications ……..……………..…… 15
22.
EOE-034/EOE-044: Space Sciences ….………………………………….…… 16
23.
EOE-035/EOE-045: Polymer Science & Technology …………..……….…… 16
24.
EOE-036/EOE-046: Nuclear Science ……………………………..…….…….. 17
25.
EOE-037/EOE-047: Materials Science ……………………………..….……… 17
26.
EOE-038/EOE-048: Discrete Mathematics…………………………..………..
27.
EHU-301/EHU-401: Industrial Psychology ……………………………………. 19
28.
EHU-302/EHU-402: Industrial Sociology………………………………………. 20
29.
EHU-111: Human Values & Professional Ethics............................................. 20
1
7
18
2
NEW STUDY AND EVALUATION SCHEME
B.Tech. Electronics Engineering/ B.Tech. Electronics & Communication Engineering
Evaluation Scheme
S.
No.
Periods
Course
Code
Subject
Total
Sessional Exam.
Subject
ESE
L
T
P
CT
TA
Total
Credits
[Effective from the session 2010-11]
Year-II, Semester-III
THEORY
EHU-301/
EHU-302
EAS-301/
EOE-031
EOE-038
Industrial Psychology/ Industrial
Sociology
2
0
0
15
10
25
50
75
2
Mathematics-III/ Science Based
Open Elective
3
1
0
30
20
50
100
150
4
3.
EEC-301
Fundamental of Electronics Devices
3
1
0
30
20
50
100
150
4
4.
EEC-302
Digital Electronics
3
1
0
30
20
50
100
150
4
5.
EEC-303
Electromagnetic Field Theory
3
1
0
30
20
50
100
150
4
6.
EEC-304
Fundamental of Network Analysis
3
1
0
30
20
50
100
150
4
7.
EHU-111
*Human Values & Professional Ethics
2
2
0
15
10
25
50
75
-
1.
2.
PRACTICAL/DESIGN/DRAWING
8.
EEC-351
Electronics Engineering Lab – I
0
0
2
-
20
20
30
50
1
9.
EEC-352
Digital Electronics Lab – I
0
0
2
-
20
20
30
50
1
10.
EEC-353
Electronics Workshop & PCB Lab
0
0
2
-
10
10
15
25
1
11.
GP-301
General Proficiency
-
-
-
-
-
50
-
50
1
Total
19
7
6
165
160
375
625
1000
*Human values & Professional Ethics will be offered as a compulsory audit course for which passing
marks are 40% in theory & 50% in aggregate. Students will be required to audit it with in the period of
their study. There will not be carry over facility for this course and the failed student will be required to
repeat this course (in next-semester).
L
T
P
CT
TA
ESE
- Lecture
- Tutorial
- Practical
- Cumulative Test
- Teacher’s Assessment
- End Semester Exam.
3
26
NEW STUDY AND EVALUATION SCHEME
B.Tech. Electronics Engineering/ B.Tech. Electronics & Communication Engineering
Evaluation Scheme
S.
No.
Periods
Course
Code
Subject
Subject
Total
Sessional Exam.
ESE
L
T
P
CT
TA
Total
Credits
[Effective from the session 2010-11]
Year-II, Semester-IV
THEORY
EHU-401/
EHU-402
EOE-041EOE-048
EAS-401
Industrial Psychology/ Industrial
Sociology
2
0
0
15
10
25
50
75
2
Science Based Open Elective/
Mathematics-III
3
1
0
30
20
50
100
150
4
3.
EEC-401
Electronics Circuits
3
1
0
30
20
50
100
150
4
4.
EEC-402
Computer architecture & Organization
3
1
0
30
20
50
100
150
4
5.
EEC-403
Electronics Instrumentation and
Measurements
3
1
0
30
20
50
100
150
4
6.
EEC-404
Signals and Systems
3
1
0
30
20
50
100
150
4
7.
EHU-111
*Human Values & Professional Ethics
2
2
0
15
10
25
50
75
-
1.
2.
PRACTICAL/DESIGN/DRAWING
8.
EEC-451
Electronics Engineering Lab – II
0
0
2
-
20
20
30
50
1
9.
EEC-452
Digital Electronics Lab – II
0
0
2
-
20
20
30
50
1
10.
EEC-453
Measurement Lab
0
0
2
-
10
10
15
25
1
11.
GP-401
General Proficiency
-
-
-
-
-
50
-
50
1
Total
19
7
6
165
160
375
625
1000
*Human values & Professional Ethics will be offered as a compulsory audit course for which passing
marks are 40% in theory & 50% in aggregate. Students will be required to audit it with in the period of
their study. There will not be carry over facility for this course and the failed student will be required to
repeat this course (in next-semester).
L
- Lecture
T
- Tutorial
P
- Practical
CT - Cumulative Test
TA - Teacher’s Assessment
ESE - End Semester Exam.
4
26
EAS-301/EAS-401: MATHEMATICS –III
LTP
310
Unit – I
10
Function of Complex variable
Analytic function, C-R equations, Cauchy‟s integral theorem, Cauchy‟s integral formula for derivatives of
analytic function, Taylor‟s and Laurent‟s series, singularities, Residue theorem, Evaluation of real
2
integrals of the type
0
f (Cos .Sin )d and
f ( x) dx .
Unit – II
08
Statistical Techniques- I
Moments, Moment generating functions, Skewness, Kurtosis, Curve fitting, Method of least squares,
Fitting of straight lines, Polynomials, Exponential curves etc., Correlation, Linear, non –linear and multiple
regression analysis, Probability theory.
Unit – III
Statistical Techniques - II
08
Binomial, Poisson and Normal distributions, Sampling theory (small and large), Tests of significations:
Chi-square test, t-test, Analysis of variance (one way), Application to engineering, medicine, agriculture
etc.
Time series and forecasting (moving and semi-averages), Statistical quality control methods, Control
charts, x , R, p, np, and c charts.
Unit – IV
Numerical Techniques – I
08
Zeroes of transcendental and polynomial equation using Bisection method, Regula-falsi method and
Newton-Raphson method, Rate of convergence of above methods.
Interpolation: Finite differences, difference tables, Newton‟s forward and backward interpolation,
Lagrange‟s and Newton‟s divided difference formula for unequal intervals.
Unit – V
08
Numerical Techniques –II
Solution of system of linear equations, Gauss- Seidal method, Crout method. Numerical differentiation,
Numerical integration , Trapezoidal , Simpson‟s one third and three-eight rules, Solution of ordinary
differential (first order, second order and simultaneous) equations by Euler‟s, Picard‟s and forth-order
Runge- Kutta methods.
Text Book:
1. J.N. Kapur, Mathematical Statistics, S. Chand & Company Ltd.
Reference Books :
rd
1. R.K. Jain & S.R.K. Iyenger, Advance Engineering Mathematics, Narosa Publication House,3
Edition.
2. Chandrika Prasad, Advanced Mathematics for Engineers, Prasad Mudralaya.
3. “Computer Based Numerical and Statistical Techniques”, by Pundir & Pundir.
th
4. B.S. Grewal, Higher Engineering Mathematics, Khanna Publishers, 36 Edition 2008.
5. Devi Prasad, An introduction to Numerical Analysis, Narosa Publication house, New Delhi.
EEC-301: FUNDAMENTALS OF ELECTRONICS DEVICES
LTP
310
Unit – I
08
Crystal Properties and charge carriers in Semiconductors: Elemental and compound semiconductor
materials crystal lattice structure. Bonding forces and energy bands in solids, charge carriers in
semiconductors, carrier concentrations, drift of carriers in electric and magnetic fields.
5
Unit – II
08
Excess Carriers in Semiconductors: Optical absorption, luminescence, carrier life time and photo
conductivity, diffusion of carriers.
Unit – III
08
Junction Properties: Equilibrium conditions, biased junctions, steady state conditions, reverse bias break
down, transient and AC condition. Metal semiconductor junctions.
Unit – IV
08
Transistors: Metal-semiconductor-field-effect-transistors (MESFET), Metal-insulator-semiconductor-fieldeffect-transistors (MISFET), Metal oxide semiconductor field effect transistor (MOSFET): Construction,
Operation and characteristics of above devices.
Bipolar junction transistors: Fundamental of BJT operation, amplification with BJTs.
Unit – V
08
Some special devices: Photodiodes, photo detectors, solar cell, light emitting diodes, semiconductor
lasers, light emitting materials.
Tunnel Diode: degenerate semiconductors.
IMPATT diode:
The transferred electron mechanism: The GUNN diode.
P-N-P-N diode, semiconductor controlled rectifier (SCR), bilateral devices: DIAC, TRIAC, IGBT.
Text Books:
th
1. Sanjay Sharma,“Solid state devices and circuits”, S.K.Kataria & Sons, 5 Edition.
2. Sanjeev Gupta, “Electronic Devices and Circuits”, Dhanpat Rai Publication.
Reference Book:
nd
1. Miliman & Halkias, “Electronic Devices & circuits”, 2 Edition.
EEC-302: DIGITAL ELECTRONICS
LTP
310
Unit – I
08
Digital system and binary numbers: Signed binary numbers, binary codes, cyclic codes, error detection
and correcting codes, hamming codes.
Floating point representation Gate-level minimization: The map method up to five variablem don‟t care
conditions, POS simplification, NAND and NOR implementation. Quine Mc-Clusky method (Tabular
method).
Unit – II
08
Combination Logic: Combinational circuits, analysis procedure, design procedure, binary addersubtractor, decimal adder, binary multiplier, magnitude comparator, decoders, encoders, multiplexers.
Unit – III
08
Synchronous Sequential logic: Sequential circuits, storage elements: latches, flip flops, analysis of
clocked sequential circuits, state reduction and assignments, design procedure.
Registers and counters: Shift registers, ripple counter, synchronous counter, other counters.
Unit – IV
08
Memory and programmable logic: RAM, ROM, PLA, PAL.
Design at the register transfer level: ASMs, design example, design with multiplexers.
Unit – V
08
Asynchronous sequential logic: Analysis procedure, circuit with latches, design procedure, reduction of
state and flow table, race free state assignment hazards.
Text Book:
rd
1. P.Raja, “Switching Theory”, 3 Edition, Umesh Publication.
Reference Books:
nd
1. Rao, “Switching theory & logic design”, 2 Edition.
2. Hill & Peterson, “Switching Circuit & Logic Design”, Wiley.
6
EEC-303: ELECTROMAGNETIC FIELD THEORY
LTP
310
Unit – I
06
Coordinate systems and transformation: Cartesian coordinates, circular cylindrical coordinates, spherical
coordinates.
Vector calculus: Differential length, area and volume, line surface and volume integrals, del operator,
gradient of scalar, divergence of vector and divergence theorem curl of a vector and Stoke‟s theorem,
Laplacian of scalar.
Unit – II
10
Electrostatics: Electrostatics fields, Coulombs law and field intensity, Electric field due to charge
distribution Electric flux density, Gausses‟s Law – Maxwell‟s equation. Electric dipole and flux lines,
energy density in electrostatic fields.
Electric field in material space: Properties of materials convection and conduction currents, conductors,
polarization in dielectrics, dielectric constants, continuity equation and relaxation time, coundary
condition.
Electrostatic boundary value problems: Poission‟s or Laplace‟s equations, general procedures for soling
Poission‟s or Laplace‟s equations, resistance and capacitance, method of images.
Unit – III
08
Magnetostatics: Magneto-static fields, Biot-Savart‟s Law, Ampere‟s circuit law, Maxwell‟s equation,
application of ampere‟s law, magnetic flux density – Maxwell‟s equation, Maxwell‟s equation for static
fields, magnetic scalar and vector potential.
Magnetic forces, materials and devices: Forces due to magnetic field, magnetic torque and moment, a
magnetic dipole, magnetization in materials, magnetic boundary conditions, inductors and inductances,
magnetic energy.
Unit – IV
08
Waves and applications: Maxwell‟s equation, Faraday‟s Law, transformer and motional electromotive
forces, displacement current, Maxwell‟s equation in final form.
Electromagnetic wave propagation: Wave propagation in lossy dielectrics, plane waves in lossless
dielectrics, plane wave in free space, plain wave in free space, plain waves in good conductors, power
and the pointing vector, reflection of a plain wave in a normal incidence.
Unit – V
08
Transmission lines: Transmission line parameters, Transmission line equations, input impedance,
standing wave ratio and power. The smith chart, Some applications of transmission lines.
Text Books:
th
1. M. N. O. Sadiku, “Elements of Electromagnetics”, 4 Edition, Oxford University Press.
nd
2. Jordan and Balmain, “Electromagnetic Waves & Radiating System”, 2 Edition.
Reference Books:
1. K. D. Prasad, “ Antenna and Wave Propagation”, Edition-2009, Satya Prakashan New Delhi.
th
2. W.H. Hayt and J.A. Buck, “Electromagnetic field theory”, 7 Edition, TMH.
EEC-304: FUNDAMENTAL OF NETWORK ANALYSIS & SYNTHESIS
LTP
310
Unit – I
10
Signal analysis, complex frequency, network analysis, network synthesis, General Characteristics and
descriptions of signals, step function and associated wave forms, the unit impulse.
Introduction to network analysis, network elements, initial and final conditions, step and ampluse
response, solution of network equations.
7
Unit – II
08
Review of Laplace transforms, poles and zeroes, intial and final value theorems, The transform circuit,
Thevenin‟s and Norton‟s theorems, the system function, step and impulse reponses, the convolution
integral.
Amlitude and phase responses.
Network functions, relation between port parameters, transfer function using two port parameters,
interconnection of two ports.
Unit – III
08
Hurwitz polynomials, positive real functions.
Proreties of real immittance functions, synthesis of LC driving point immittances, properties of RC driving
point impendances synthesis of RC impedances or RL admittances, properties of RL impedances and RC
admittances.
Unit – IV
06
Properties of transfer Functions, zeroes of transmission, synthesis of Y21, and Z21 with
Unit – V
Introduction to active network synthesis.
1
terminations.
08
Text Book:
st
1. D. Roy Choudhary, “Network and Systems“, 1 Edition, New Age Publication.
Reference Books:
rd
1. M.E. Van Valkenberg, “Network Analysis”, 3 Edition, Prentice Hall of India Ltd.
st
2. S.P. Gosh, A.K. Chakraborty, “Network Analysis and Synthesis”, 1 Edition, TMH.
th
3. Chakraverty, “Network Analysis with Applications”, 4 Edition, Stanley-Pearson.
nd
4. Franklin F. Kuo, “Network Analysis and Synthesis”, 2 Edition, Wiley India Pvt. Ltd.
EEC-351: ELECTRONICS ENGINEERING LAB - I
LTP
002
Objective: To attain expertise in lab equipment handling and understanding the basic devices, their
properties, characteristics in detail. Along with their practical usage in the circuit.
1. Study of lab equipments and components: CRO, Multimeter, Function Generator, Power
supply-Active, Passive Components & Bread Board.
2. P-N Junction Diode: Characteristics of PN Junction diode-Static and dynamic resistance
measurement from graph.
3. Applications of PN junction diode: Half & Full wave rectifier- Measurement of Vrms, Vdc, and
ripple factor-use of filter- ripple reduction (RC Filter)-Clipper & Clamper.
4. Properties of junctions Zener diode characteristics. Heavy doping alters the reverse
characteristics. Graphical measurement of forward and reverse resistance.
5. Application of Zener diode: Zener diode as voltage regulator. Measurement of percentage
regulation by varying load resistor.
6. Characteristic of BJT: BJT in CB and CE configuration- Graphical measurement of h
parameters from input and output characteristics. Measurement of Av, AI, Ro and Ri of CE
amplifier with potential divider biasing.
7. Characteristic of FET: FET in common source configuration. Graphical measurement of its
parameters gm, rd & m from input and output characteristics.
8. Characteristic of silicon-controlled rectifier.
9. To plot V-I Characteristics of DIAC.
10. To draw V-I characteristics of TRIAC for different values of Gate Currents.
8
EEC-352: DIGITAL ELECTRONICS LAB - I
LTP
002
Objective: To understand the digital logic and create various systems by using these logics.
1. Implementation of the given Boolean function using logic gates in both SOP and POS forms.
2. Verification of state tables of RS, JK, T and D flip-flops using NAND & NOR gates.
3. Implementation and verification of Decoder/De-multiplexer and Encoder using logic gates.
4. Implementation of 4x1 multiplexer using logic gates.
5. Implementation of 4-bit parallel adder using 7483 IC.
6. Design, and verify the 4-bit synchronous counter.
7. Design, and verify the 4-bit asynchronous counter.
EEC-353: ELECTRONIC WORKSHOP & PCB LAB
LTP
002
Objective: To create interest in Hardware Technology.
1. Winding shop: Step down transformer winding of less than 5VA.
2. Soldering shop: Fabrication of DC regulated power supply.
3. PCB Lab: (a) Artwork & printing of a simple PCB.
(b) Etching & drilling of PCB.
4. Wiring & fitting shop: Fitting of power supply along with a meter in cabinet.
5. Testing of regulated power supply fabricated.
Fabricate and test the audio amplifier circuit by using above power supply.
EEC-401: ELECTRONIC CIRCUITS
LTP
310
UNIT- I
08
Operational Amplifier: Inverting and non-inverting configurations, difference amplifier, Effect of finite
open loop gain and bandwidth on circuit performance, Large signal operation of op-amp.
UNIT- II
08
MOSFET: Review of device structure operation and V-I characteristics. Circuits at DC, MOSFET as
Amplifier and switch, Biasing in MOS amplifier circuits, small-signal operation and models, single stage
MOS amplifier, MOSFET internal capacitances and high frequency model, frequency response of CS
amplifier.
UNIT- III
08
BJT: Review of device structure operation and V-I characteristics, BJT circuits at DC, BJT as amplifier
and switch, biasing in BJT amplifier circuit, small-signal operation and models, single stage BJT amplifier,
BJT internal capacitances and high frequency model, frequency response of CE amplifier.
UNIT- IV
08
Differential Amplifier: MOS differential pair, small signal operation of the MOS differential pair, BJT
differential pair, other non-ideal characteristic of the Differential amplifier (DA), DA with active load.
UNIT- V
08
Feedback: The general feed back structure, properties of negative feed back, the four basic feed back
topologies, the series-shunt feedback amplifier, the series-series feedback amplifier, the shunt-shunt and
shunt series feedback amplifier.
Oscillators: Basic principles of sinusoidal oscillators, op-amp RC oscillator circuits, LC oscillator.
Test Book:
1. Sanjeev Gupta, “Electronic device & Circuits”, Dhanpat Rai Publication, 2000.
Reference Book:
th
1. A.S. Sedra and K.C. Smitd, “Microelectronic Circuits”, Oxford University Press, 5 Edition.
9
EEC-402: COMPUTER ARCHITECTURE AND ORGANIZATION
LTP
310
UNIT- I
08
Introduction to Design Methodology: System Design – System representation, Design Process, the gate
level (revision), the register level components and PLD (revision), register level design.
The Processor Level: Processor level components, Processor level design.
UNIT- II
08
Processor basics: CPU organization- Fundamentals, Additional features Data Representation – Basic
formats, Fixed point numbers, Floating point numbers.
Instruction sets – Formats, Types, Programming considerations.
UNIT- III
06
Datapath Design: Fixed point arithmetic – Addition and subtraction, Multiplication and Division, Floating
point arithmetic, pipelining.
UNIT- IV
08
Control Design: basic concepts – introduction, hardwired control, Micro programmed control –
introduction, multiplier control unit, CPU control unit, Pipeline control- instruction pipelines, pipeline
performance.
UNIT- V
10
Memory organization: Multi level memories, Address translation, Memory allocation, Caches – Main
features, Address mapping, structure vs performance, System Organisation: Communication methodsbasic concepts, bus control.
Introduction to 8085.
Text Book:
rd
1. M. Morris Mano,” Computer System Architecture”, Pearson Education, 3 Edition 2008.
Reference Book:
1. John P Hayes, “Computer Architecture and Organisation”, McGraw Hilll 3rd Edition.
EEC-403: ELECTRONIC INSTRUMENTATION AND MEASUREMENTS
LTP
310
UNIT- I
08
Unit, dimensions and standards: Scientific notations and metric prefixes. SI electrical units, SI
temperature scales, Other unit systems, dimension and standards.
Measurement Errors: Gross error, systematic error, absolute error and relative error, accuracy, precision,
resolution and significant figures, Measurement error combination, basics of statistical analysis.
PMMC instrument, galvanometer, DC ammeter, DC voltmeter, series ohm meter.
UNIT- II
08
Transistor voltmeter circuits, AC electronic voltmeter, current measurement with electronic instruments,
multimeter probes.
Digital voltmeter systems, digital multimeters, digital frequency meter system.
UNIT- III
08
Voltmeter and ammeter methods, Wheatstone bridge, low resistance measurements, low resistance
measuring instruments.
AC bridge theory, capacitance bridges, Inductance bridges, Q meter.
UNIT- IV
08
CRO: CRT, wave form display, time base, dual trace oscilloscope, measurement of voltage, frequency
and phase by CRO, Oscilloscope probes, Oscilloscope specifications and performance.
Delay time based Oscilloscopes, Sampling Oscilloscope, DSO, DSO applications.
UNIT- V
08
Instrument calibration: Comparison method, digital multimeters as standard instrument, calibration
instrument.
10
Recorders: X-Y recorders, plotters.
Text Books:
1. A.K. Sawhney, “Electronic Instrumentation and Measurements”, Dhanpat Rai & Co.
2. David A. Bell, “Electronic Instrumentation and Measurements”, 2nd Ed., PHI, New Delhi 2008.
Reference Books:
1. Oliver and Cage, “Electronic Measurements and Instrumentation”, TMH, 2009.
2. Alan S. Morris, “Measurement and Instrumentation Principles”, Elsevier (Buterworth Heinmann),
2008.
EEC-404: SIGNALS AND SYSTEMS
LTP
310
UNIT- I
08
Signals: Definition, types of signals and their representations: continuous-time/discrete-time, eriodic/nonperiodic, even/odd, energy/power, deterministic/ random, one-dimensional/multidimensional; commonly
used signals (in continuous-time as well as in discrete-time): unit impulse, unit step, unit ramp (and their
interrelationships), exponential, rectangular pulse, sinusoidal; operations on continuous-time and
discrete-time signals (including transformations of independent variables).
UNIT- II
08
Laplace-Transform (LT) and Z-Transform (ZT):
i.
One-sided LT of some common signals, important theorems and properties of LT, inverse LT,
solutions of differential equations using LT, Bilateral LT, Regions of convergence (ROC).
ii.
One sided and Bilateral Z-transforms, ZT of some common signals, ROC, Properties and
theorems, solution of difference equations using one-sided ZT, s- to z-plane mapping.
UNIT- III
08
Fourier Transforms (FT):
i.
Definition, conditions of existence of FT, properties, magnitude and phase spectra, Some
important FT theorems, Parseval‟s theorem, Inverse FT, relation between LT and FT .
ii.
Discrete time Fourier transform (DTFT), inverse DTFT, convergence, properties and theorems,
Comparison between continuous time FT and DTFT.
UNIT- IV
08
Systems: Classification, linearity, time-invariance and causality, impulse response, characterization of
linear time-invariant (LTI) systems, unit sample response, convolution summation, step response of
discrete time systems, stability.
convolution integral, co-relations, signal energy and energy spectral density, signal power and power
spectral density, properties of power spectral density.
UNIT- V
08
Time and frequency domain analysis of systems: Analysis of first order and second order systems,
continuous-time (CT) system analysis using LT, system functions of CT systems, poles and zeros, block
diagram representations; discrete-time system functions, block diagram representation, illustration of the
concepts of system bandwidth and rise time through the analysis of a first order CT low pass filter.
Text Books:
1. Ramesh Babu, “ Signal & Systems”, 2006.
th
2. Sanjay Sharma, “Signal & Systems”, S.K. Kataria & Sons, 4 Edition.
Reference Books:
1. Chi-Tsong Chen, `Signals and Systems‟, 3rd Ed., Oxford University Press, 2004
2. V. Oppenheim, A.S. Willsky and S. Hamid Nawab, „Signals & System‟, Pearson Education, 2nd
Ed., 2003.
3. P. Ramakrishna Rao, `Signal and Systems‟, 2008 Ed., Tata McGraw Hill, New Delhi.
11
EEC-451: ELECTRONICS ENGINEERING LAB II
LTP
002
Objective: To design and implement the circuits to gain knowledge on performance of the circuit and its
application.
1. Measurement of Operational Amplifier Parameters- Common Mode Gain, Differential Mode
Gain, CMRR, Slew Rate.
2. Applications of Op-amp- Op-amp as summing amplifier, Difference amplifier, Integrator and
differentiator.
3. Field Effect Transistors- Single stage Common source FET amplifier –plot of gain in dB Vs
frequency, measurement of, bandwidth, input impedance, maximum signal handling capacity
(MSHC) of an amplifier.
4. Bipolar Transistors- Design of single stage RC coupled amplifier –design of DC biasing circuit
using potential divider arrangement –Plot of frequency Vs gain in dB. Measurement of bandwidth
of an amplifier, input impedance and Maximum Signal Handling Capacity of an amplifier.
5. Two stage Amplifier- Plot of frequency Vs gain. Estimation of Q factor, bandwidth of an
amplifier.
6. Common Collector Configuration-Emitter Follower (using Darlington pair)-Gain and input
impedance measurement of the circuit.
7. Power Amplifiers- Push pull amplifier in class B mode of operation –measurement of gain.
8. Differential Amplifier– Implementation of transistor differential amplifier .Non ideal
characteristics of differential amplifier.
9. Oscillators- Sinusoidal Oscillators- (a) Wein bridge oscillator (b) phase shift oscillator.
10. Simulation of Amplifier circuits studied in the lab using any available simulation software and
measurement of bandwidth and other parameters with the help of simulation software.
EEC-452: DIGITAL LAB – II
LTP
002
1.
2.
3.
4.
5.
6.
7.
8.
9.
TTL Transfer Characteristics and TTL IC Gates.
CMOS Gate Transfer Characteristics.
Implementation of a 3-bit SIPO and SISO shift registers using flip-flops.
Implementation of a 3-bit PIPO and PISO shift registers using flip-flops.
Design of Seven segment display driver for BCD codes.
BCD Adders & Subtractors.
ALU
Stack, Pointer.
8085 Assembly Language Programming.
EEC-453: MEASUREMENT LAB
LTP
002
1.
2.
3.
4.
5.
Study of semiconductor diode voltmeter and its us as DC average responding AC voltmeter.
Study of L.C.R. bridge and determination of the value of the given components.
Study of distortion factor meter and determination of the % distortion of the given oscillator.
Study of the transistor tester and determination of the parameters of the given transistors.
Study of the following transducer (i) PT-100 trans (ii) J- type trans (iii) K-type trans (iv) Presser
trans
6. Measurement of phase difference and frequency using CRO (lissajous figure).
7. Measurement of low resistance Kelvin‟s double bridge.
8. Radio Receiver Measurements.
12
List of Open Electives for B. Tech. Courses
SCIENCE BASED OPEN ELECTIVE
EOE-O31/EOE-041
EOE-032/EOE-042
EOE-033/EOE-043
EOE-034/EOE-044
EOE-035/EOE-045
EOE-036/EOE-046
EOE-037/EOE-047
EOE-038/EOE-048
Introduction to Soft Computing (Neural Networks, Fuzzy Logic and
Genetic Algorithm)
Nano Sciences
Laser Systems and Applications
Space Sciences
Polymer Science & Technology
Nuclear Science
Material Science
Discrete Mathematics
13
SCIENCE BASED OPEN ELECTIVES
EOE-031/EOE-041: INTRODUCTION TO SOFT COMPUTING
(Neural Networks, Fuzzy Logic and Genetic Algorithm)
L T P
3 1 0
Unit- I
08
Neural Networks-I (Introduction &Architecture)
Neuron, Nerve structure and synapse, Artificial Neuron and its model, activation functions, Neural
network architecture: single layer and multiplayer feed forward networks recurrent networks. Various
learning techniques; Perception and convergence rule.
Auto-associative and hetro-associative memory.
Unit- II
08
Neural Networks-II (Back propogation networks)
Architecture: perceptron model, solution, single layer artificial neural network, multiplayer perception
model; back propogation learning methods, effect of learning rule co-efficient back propagation algorithm,
factors affecting back propagation training, applications.
Unit- III
08
Fuzzy Logic-I (Introduction)
Basic concepts of fuzzy logic. Fuzzy sets and Crisp sets Fuzzy set theory and operations Properties of
fuzzy sets, Fuzzy and Crisp relations, Fuzzy to Crisp conversion.
Unit- IV
08
Fuzzy Logic-II (Fuzzy Membership, Rules)
Membership functions, interference in fuzzy logic, fuzzy if-then rules, Fuzzy implications and Fuzzy
algorithms, Fuzzyfications & Defuzzifications, Fuzzy Controller, Industrial applications.
Unit- V
08
Genetic Algorithm (GA)
Basic concepts, working principle, procedures of GA, flow chart of GA, Genetic representations,
(encoding) initialization and selection, Genetic operators, Mutation, Generational Cycle, applications.
Text Books:
1. S. Rajsekaran & G A. Vijayalakshmi Pal, “Neural Networks Fuzzy Logic and Genetic Algorithm
Synthesis and Applications" Prentice Hall of India.
2. N.P. Pady, "Artificial Intelligence and Intelligent Systems" Oxford University Press.
Reference Books:
3. Siman Hykin, "Neural Networks' Trentice Hall of India.
4. Timothy J Ross, "Fuzzy Logic with Engineering Applications" Wiley India.
5. Kumar Satish, "Neural Networks" Tata Me Graw Hill.
EOE-032/EOE-042: NANO SCIENCES
L T P
3 1 0
UNIT- I
06
Introduction:
Definition of Nano-Science and Nano Technology, Applications of Nano-Technology
Introduction to Physics of Solid State:
Structure: Size dependence of properties; crystal structures, face centered cubic nanoparticles;
Tetrehedrally bounded semiconductor structures, lattice vibrations.
Energy Bands: Insulators semiconductor and conductors; Reciprocal space Energy bands and gaps of
semiconductors; effective masses; Fermi Surfaces.
Localized Particles: Accepters and deep taps; mobility; Excitons.
UNIT- II
07
Quantum Theory For None Science:
Time dependent and time Independent Schrodinger wave equations.
14
Particle in a box, Potential step: Reflection and tunneling (Quantum leak). Penetration of Barrier, Potential
box (Trapped particle in 3D: Nanodot), Electron trapped in 2D planef None sheet), Quantum confinerment
effect in nano materials.
Quantum Wells, Wires and Dots
Preparation of Quantum Nanostructure; Size and Dimensionality effect, Formigas Potential wells; Partial
confinement Excitons; Single electron Tunneling, Infrared electors; Quantum dot laser Superconductivity.
Properties of Individual Nano particles
Metal Nano clusters: Magic Numbers: Theoretical Modelling of Nanopraticles, geometric structure;
electronic structure; Reactivity; Fluctuations Magnetic CIusters; Bulle to Nano structure.
Semi conducting Nanoparticles: Optical properties: Photofragmentation: Coulmbic explosion
Rare Gas & Molecular Clusters: Inert gas clusters Superfluid clusters molecular clusters.
UNIT- III
08
Growth Techniques of Nanomaterials:
Lithographic and Nonlithographic techniques, Sputtering and film deposition in glow discharge, DC
sputtering technique (p-CuAIO2 deposition). Thermal evaporation technique, E-beam evaporation,
Chemical Vopour deposition (CVD), Synthesis of carbon nano-fibres and multi- walled carbon nanotubes.
Pulsed Laser Deposition Molecular beam Epitoxy. Sol-Gel Technique (No chemistry required), Synthesis
of nanowires/rods Electrodeposition, Chemical bath deposition, Ion beam deposition system. VaporLiquid-Solid (VLS-) method of nanowires.
UNIT- IV
08
Methods of Measuring Properties:
Structure: Crystallography particle size determination surface structure.
Microscopy: Scanning Prob Microscopy (SPM), Atomic Force Microscopy (AFM), Field Ion Microscopy,
Scanning Electron Microscopy, Transmission Electron Microscopy (TEM).
Spectroscopy: Infra red and Raman Spectroscopy, X-ray Spectroscopy, Magnetic resonance Optical
and Vibrational Spectroscopy Luninscence.
UNIT- V
07
Buckey Ball:
Nano structures of carbon (fullerene):
Carbon nano-tubes: Fabrication, structure, electrical, mechanical and vibrations properties and
applications.
Nano diamond. Boron Nitride Nano-tubes, single electron transistors Molecular machine NanoBiometrics, None Robots.
Text/Reference Books:
1. C.P. Peele, Jr. F. J. Owens, “lntroduction to Nanotechnology”.
2. “Introduction to S.S. Physis”- (latest edn.)Wiley.
3. S. Sunganp & H. Koizuoni, “Microcluster Physics”-Springor .
4. “Hanboole of Nanostructured Materials & Nanotechnology” vol. 5, Academic Press.
5. A.K. Bandyopadhyay, “Nano Materials” New Age International.
EOE-033/EOE-043: LASER SYSTEMS AND APPLICATIONS
LPT
310
UNIT- I & II
15
Introduction: Review of elementary quantum physics. Schrödinger equation concept of coherence,
absorption spontaneous emission and stimulated emission processes, relation between
Einstein's A and B coefficients population inversion, pumping, gain, optical cavities.
UNIT- III & IV
18
Lasers & Laser Systems: Main components of Laser, principIe of Laser action introduction to general
lasers and thelr types. Three & four level Lasers, CW & Pulsed Lasers, atomic, ionic, molecular, excimer,
liquid and solid state Lasers and systems, short pulse generation and Measurement.
15
UNIT- V
07
Applications: Laser applications in medicine and surgey, materials processing optical communication,
metrology and LIDAR and holography.
Text/ Reference Books:
1. K.R. Nambiar, “Laser Principles, Types and Application”, New Age International.
2. S.A. Ahmad, “Laser concepts and Applications”, New Age International.
EOE-034/EOE-044: SPACE SCIENCES
LPT
310
UNIT- I
04
Introduction: Introduction to space science and applications, historical development.
UNIT- II
12
Solar System: Nebular theory of formation of our Solar System. Solar wind and nuclear reaction as the
source of energy.
Sun and Planets: Brief description about shape size, period of rotation about axis and period of
revolution, distance of planets from sun, Bode's Law, Kepler's Laws of planetary motion, Newton's
deductions from Kepler's laws Newton's Law of gravitation correction of Kepler's third law, detenuination
of mass of earth, determination of mass of planets with respect to earth. Brief description of Asteroids,
Satellites and Comets.
UNIT- III
10
Stars: Stellar spectra and structure stellar evolution, nucleosynthesis and formation of elements.
Classification of stars: Harvard classification system Hertzsprung-Russel diagram Luminosity of star,
variable stars; composite stars (white dwarfs Neutron stars, black hole, star clusters, supernova and
binary stars); Chandrasekhar limit.
UNIT- IV
06
Galaxies: Galaxies and their evolution and origin, active galaxies and quasars.
UNIT- V
08
Creation of Universe: Early history of the universe, Big-Bang and Hubble expansion model of the
universe cosmic microwave background radiation, dark matter and dark energy.
Text Books/Reference Books:
1. K.S. Krishnaswami, "Astrophysics Amodern Perspective”, New Age International.
2. K.S. Krishnaswami, “Understanding cosmic Panorama”, New Age International.
EOE-035/EOE-045: POLYMER SCIENCE AND TECHNOLOGY
LTP
310
UNIT- I & II
18
POLYMERS:
Introduction, chemistry of polymer synthesis, polymer reaction kinetics, physical properties and
characterization of polymers, effect of structure on properties of polymers, organic polymers. Introduction
to high performance polymers and composites and their processing.
UNIT- III & IV
13
POLYMERIZATION:
Introduction, step-growth polymerization, free radical chain growth polymerization, emulsion
polymerization, ionic and cationic polymerization, chain statistics and rubber elasticity.
UNIT- V & VI
09
PREPARATION AND APPLICATIONS:
Preparation, properties and technical applications of thermo-plastics (PVC, PVA), thermostats (PF, UF)
and elastomers(SBR, GR-N), silicones, Application of polymers in space, ocean, electronics, medical,
agriculture, automobile, sports and building construction.
16
EOE-036/EOE-046: NUCLEAR SCIENCE
LTP
310
UNIT- I
08
Nucleus and Its Basic Features:
Nuclear structure; nuclear forces and their properties, nuclear stability nuclear radius and its
measurement, nuclear spin, nuclear magnetic and electrical moments.
UNIT- II
08
Nuclear models:
Single particle model liquid drop model and semi-emperical mass formula nuclear potential and shell
model collective model.
UNIT-Ill
08
Nuclear Reaction:
Nuclear reaction and laws of conservation, Types of nuclear reaction mechanism of nuclear reaction,
nuclear fission & binuclear fusion and their explanation by liquid drop model.
UNIT-IV
08
Nuclear Decay:
Decay constant, half life period and mean life alpha decay, beta decay, gamma decay, interaction of
nuclear radiation with matter.
Nuclear Instruments-I
Mass spectrograph: General principle, Aston's Mass Spectrograph.
UNIT-V
08
Nuclear Instruments-Il
Accelerators: Van de Graph Generator Cyclotron Synchrotron.
Detectors:
G.M. Counter, Scintillation counter, cloud chamber Bubble Chamber, production and detection of
neutrons and Gamma-photon.
Application of Nuclear Techniques: Nuclear magnetic resonance, position emission topography,
radiotracer techniques and applications in material science and agriculture.
Text Books:
1. Tayal, “Nuclear Physics” Himalaya Publishing House.
2. S.N. Ghosal, “Nuclear Physics”, S. Chand & Co.
3. S. B. Patel, “Nuclear Physics: An introduction”, New Age International.
4. H. B. Lai, “Introductory Nuclear Physics", United Book Depot.
5. Wang “Introductory Nuclear Physics”, PHI Learning.
Reference Books:
1. Roy & Nigam, “Nuclear Physics”, John Wiley & sons.
2. W.E. Burcham, “Nuclear Physics", Longmans Publications.
3. Green, "Nuclear Physics", McGraw Hill.
EOE-037/EOE-047: MATERIAL SCIENCE
L T P
3 1 0
UNIT- I
07
Introduction:
Historical perspective, importance of materials Brief review of & atomic concepts in Physics and
Chemistry Atomic models. Periodic table Chemical Wading.
Crystallography and imperfections:
Concept of unit cell, space lattice. Bravais lattices common crystal structures. Ammic packing factor and
density, Miller indices. X-ray crystallography techniques, imperfections. Defects & Dislocations in solids.
17
UNIT- II
06
Mechanical Properties and Testing: Stress strain diagram. Ductile and brittle materials sirenss strength,
toughness, hardness, fracture, fatigue and creep Testing, such as Strength testing. Hardness testing,
Impact testing. Fatique testing, Creep testing, Non-destructive testing (NDT).
Micro Structural Exam: Microscope principle and methods. Preparation of sample and microstructure
exam and grain size determination, comparative study of microstructure of various metals and alloys,
such as Mild steel. CI, Brass.
Phase Diagram and Equilibrium Diagram: Uniary and Binary diagrams, Phase rules Types of
equilibrium diagrams; solid solution type, eutectic type and combination type Iron-carbon equilibrium
diagram.
UNIT- III
08
Ferrous materials: Iron and steel manufacture furnaces, various types of carbon steels alloy steels and
cast irons its properties and uses.
Heat Treatment: various types of heat treatment such as Annealin9, Normalizing Quenching, Tempering
and Case hardening. Time Temperature Transformation (TTT) diagrams.
Non-Ferrous metals and alloys: Non-ferrous metals, such as Cu, Al, Zn, Cr, Ni etc. and its applications.
Various types of Brass, Bronze bearing materials their properties and uses Aluminium alloys, such as
Duralumin, Other advanced materials/alloys.
UNIT- IV
07
Magnetic properties: Concept of magnetism- Dia, para, ferro magnetic materials. Hysteresis, Soft and
hard magnetic materials, Magnetic Storages.
Electric Properties: Energy band, concept of conductor, insulator and semi conductor, intrinsic and
extrinsic semi-conductors. Basic devices and their applications, diffusion of Solid.
Super conductivity and its applications, Messier effect. Type I & II superconductors. High Temp,
superconductors.
UNIT– V
09
Ceramics: Structure, types, properties and applications of ceramics Mechanical/Electrical behaviour and
processing of ceramics.
Plastics: Various types of polymers/plastics and their applications Mechanical behaviour and processing
of plastics, Future of plastics.
Other Materials: Brief description of other materials, such as optical and thermal materials, concrete,
composite materials and their uses.
Performance of materials in service: Brief theoretical consideration of fracture, fatique, and corrosion
and its control.
Text/Reference Books:
1. W.D. Callisster Jr. “Material Science & Engineering Addition"- Westy Publishing Co.
2. Van Vlash, "Elements of Material Science & Engineering", John Wiley & Sons.
3. V. Raghvan, "Material Science", Prentic Hall of India.
4. Narula, "Material Science", Tata Mc. Graw Hilt
5. Srivastava, Srinivasan, "Science of Materials Engineering" New Age International.
EOE-038/EOE-048: DISCRETE MATHEMATICS
L T P
3 1 0
UNIT- I
10
Set Theory: Definition of Sets, Venn Diagrams, complements, Cartesian products, power sets, counting
principle, cardinality and countability (Countable and Uncountable sets), proofs of some general identities
on sets, pigeonhole principle.
Relation: Definition, types of relation, composition of relations, domain and range of a relation; pictorial
representation of relation, properties of relation, partial ordering relation.
Function: Definition and types of function, composition of functions, recursively defined
functions.
18
UNIT- II
08
Propositional logic: Proposition logic, basic logic, logical connectives, truth tables, tautologies,
contradiction, normal forms (conjunctive and disjunctive), modus ponens and modus tollens, validity,
predicate logic, universal and existential quantification. Notion of proof; proof by implication, converse,
inverse, contrapositive, negation, and contradiction, direct proof, proof by using truth table, proof by
counter example.
UNIT- III
08
Combinatories: Mathematical induction, recursive mathematical definitions, basics of counting,
permutations, combinations, inclusion-exclusion, recurrence relations (Nth order recurrence relation with
constant coefficients, Homogeneous recurrence relations Inhomogeneous recurrence relation),
generating function (closed form expression, properties of G. F., solution of recurrence relation using G.F.
UNIT- IV
07
Algebraic Structure: Binary composition and its properties definition of algebraic structure, Groyas Semi
group, Monoid Groups, Abelian Group, properties of groups, Permutation Groups, Sub-Group, Cyclic
Group, Rings and Fields (definition and standard results).
UNIT- V
07
Graphs: Graph terminology, types of graph, connected graphs, components of graph. Euler graph
Hamiltonian path and circuits, Graph coloring, Chromatic number.
Tree: Definition, types of tree (rooted, binary), properties of trees binary search tree, tree traversing
(preorder, inorder, postorder).
Text Book:
1. “Discrete Mathematics”, Schaum‟s Series, TMH.
Reference Books:
1. Kenneth H. Rosen, "Discrete Mathematics and its Applications” Mc. Graw Hill, 2002.
2. J.P. Tremblay & R Manohar, "Discrete Mathematical Structure with Applications to Computer
Science" Mc. Graw Hill, 1975.
3. V. Krishnamurthy, "Combinatories: Theory and Applications", East West Press.
4. Seymour Lipschutz, MXipson, "Discrete Mathematics" Tata Mc. Graw Hill, 2005.
5. Kolman, Busby Ross, "Discrete Mathematical Structures”, Prentice Hall International.
EHU-301/EHU-401: INDUSTRIAL PSYCHOLOGY
LTP
200
Unit- I
07
Introduction to Industrial Psychology-Definitions & Scope. Major influences on industrial PsychologyScientific management and human relations schools Hawthorne Experiments.
Unit- II
06
Individual in Workplace
Motivation and Job satisfaction, stress management. Organizational culture, Leadership & group
dynamics.
Unit- III
07
Work Environment & Engineering Psychology-fatigue. Boredom, accidents and safety Job Analysis,
Recruitment and Selection-Reliability & Validity of recruitment tests.
Unit- IV
06
Performance Management: Training & Development.
References Books:
1. Miner J.B. (1992) Industrial/Organizational Psychology, N.Y.: McGraw Hill.
2. Blum & Naylor (1982) Industrial Psychology. Its Theoretical & Social Foundations CBS
Publication.
th
3. Aamodt, M.G. (2007) industrial/Organizational Psychology: An Applied Approach (5 edition)
Wadsworth/Thompson:Belmont, C.A.
19
4. Aswathappa K (2008). Human Resource Management (fifth edition) New Delhi: Tata McGraw
Hill.
EHU-302/EHU-402: INDUSTRIAL SOCIOLOGY
LTP
200
Unit- I
06
Industrial Sociology: Nature and Scope of Industrial Sociology-Development of Industrial Sociology.
Unit- II
07
Rise and Development of Industry: Early Industrialism- Type of Productive Systems- The Manorial or
feudal system The guild system- The domestic or putting- out system- and the factory systemCharacteristics of the factory system-causes and Consequences of industrialization.
Unit-III
06
Industrialization in India. Industrial Poling Resolutions-1956.
Unit-IV
07
Contemporary Issues: Grievances and Grievance handling Procedure.
Industrial Disputes: Courses, strikes & lockouts, Industrial Relation Machinery Bipartite & Tri-partite
Agreement, Labour courts & Industrial Tribunals, Code of Discipline, Standing order.
References Books:
1. GISBERT PASCAL, Fundamentals of Industrial sociology, Tata McGraw Hill Publishing Co. New
Delhi, 1972.
nd
2. SCHNEIDER ENGNO V., Industrial Sociology 2
Edition, McGraw Hill Publishing Co., New
Delhi, 1979.
3. MAMORIA C.B. And Mamoria S., Dynamics-of Industrial Relation in India.
4. SINGH G.P. and P.R.N. SINHA, Industrial Relations and Labour Legislations, New Delhi, Oxford
and IBH Publishing Co., 1977.
EHU-111: HUMAN VALUES & PROFESSIONAL ETHICS
L T P
2 0 2
Total no. of Lectures
Total no. of Practical Sessions
Content for Lectures:
: 28
: 14 (of 2hrs each)
Module 1: Course Introduction – Need, Basic Guidelines, Content and Process for Value
Education.
[6]
1. Understanding the need, basic guidelines, content and process for Value Education
2. Self Exploration – What is it? – Its content and process; „Natural Acceptance‟ and Experiential
Validation – As the mechanism for self exploration
3. Continuous Happiness and Prosperity – A look at basic Human Aspirations
4. Right understanding, Relationship and Physical Facilities – the basic requirements for fulfillment
of aspirations of every human being with their correct priority
5. Understanding Happiness and Prosperity correctly – A critical appraisal of the current scenario
6. Method to fulfill the above human aspirations: understanding and living in harmony at various
levels
Module 2: Understanding Harmony in the Human Being – Harmony in Myself?
7.
8.
9.
10.
Understanding human being as a co-existence of the sentient „I‟ and the material „Body‟
Understanding the needs of Self („I‟) and „Body‟ – Sukh and Suvindha
Understanding Body as an instrument of „I‟ (I being the doer, seer and enjoyer)
Understanding the characteristics and activities of „I‟ and harmony in „I‟
20
[6]
11. Understanding the harmony of I with the Body: Sanyam and Swasthya; correct appraisal of
Physical needs, meaning of Prosperity in detail
12. Programs to ensure Sanyam and Swasthya – Practice Exercises and Case Studies will be taken
up in Practice Sessions.
Module 3: Understanding Harmony in the Family and Society – Harmony in Human – Human
Relationship
[6]
13. Understanding harmony in the Family - the basic unit of human interaction
14. Understanding values in human – human relationship; meaning of Nyaya and program for its
fulfillment to ensure Ubhay-tripti; Trust (Vishwas) and Respect (Samman) as the foundational
values of relationship
15. Understanding the meaning of Vishwas; Difference between intention and competence
16. Understanding the meaning of Samman, Difference between respect and differentiation; the
other salient values in relationship
17. Understanding the harmony in the society (society being an extension of family): Samadhan,
Samridhi, Abhay, Sah-astitiva as comprehensive Human Goals
18. Visualizing a universal harmonious order in society – Undivided Society (Akhand Samaj),
Universal Order (Sarvbhaum Vyawastha) – from family to world family!
– Practice Exercises and Case Studies will be taken up in Practice Sessions.
Module 4: Understanding Harmony in the Nature and Existence – Whole existence as Coexistence
[4]
19. Understanding the harmony in the Nature
20. Interconnectedness in the mutual fulfillment among the four orders of nature – recyclability and
self-regulation in nature
21. Understanding Existence as Co-existence (Sah-astitva) of mutually interacting units in allpervasive space
22. Holistic perception of harmony at all levels of existence – Practice Exercises and Case Studies
will be taken up in Practice Sessions.
Module 5: Implications of the above Holistic Understanding of Harmony on Professional Ethics
[6]
23.
24.
25.
26.
Natural acceptance of human values
Definitiveness of Ethical Human Conduct
Basic for Humanistic Education, Humanistic Constitution and Humanistic Universal Order
Competence in professional ethics:
(a) Ability to utilize the professional competence for augmenting universal human order,
(b) Ability to identify the scope and characteristics of people- friendly and eco-friendly
production systems,
(c) Ability to identify and develop appropriate technologies and management patterns for
above production systems.
27. Case studies of typical holistic technologies, management models and production systems
28. Strategy for transition from the present state to Universal Human Order:
(a) At the level of individual: as socially and ecologically responsible engineers, technologists
and managers,
(b) At the level of society: as mutually enriching institutions and organizations.
Text Book:
1. R. R. Gaur, R. Sangal, G.P. Bagaria, 2009, A Foundation Course in Value Education.
Reference Books:
1. Ivan Illich, 1974, Energy & Equity, The Trinity Press , Worcester, and HarperCollins, USA
2. PL Dhar, RR Gaur, 1990, Science and Humanism, Commonwealth Purblishers.
21
3. A.N. Tripathy, 2003, Human Values, New Age International Publishers.
4. E.G. Seebauer & Robert L. Berry, 2000, Fundamentals of Ethics for Scientists & Engineers,
Oxford University Press
5. M. Govindrajran, S. Natrajan & V.S. Senthil Kumar, Engineering Ethichs (including Human
Values), Eastern Economy Edition, Prentice Hall of India Ltd.
Relevant CDs, Movies, Documentaries & Other Literature:
1.
2.
3.
4.
5.
Value Education website, http://www.uptu.ac.in
Story of Stuff, http://www.storyofstuff.com
Al Gore, An Inconvenient Truth, Paramount Classics, USA
Charlie Chaplin, Modern Times, United Artists, USA
IIT Delhi, Modern Technology - The Untold Story
***
22