Download Local probe X-ray methods at large scale facilities for studying

Local probe X-ray methods at large scale facilities for studying functional materials
Porteurs: T.W. Cornelius (IM2NP UMR 7334 CNRS), C. Mocuta (Synchrotron SOLEIL)
Divisions ou commissions dont relève cette proposition: Matière Condensée
Résumé
In recent years, enormous progress has been achieved at 3rd generation synchrotron sources (e.g.
ESRF, Synchrotron SOLEIL) on the focusing of hard X-ray beams down to the micro- and nanoscale for
studying, in a microscopy like approach, the structural and physical properties of biomaterials,
microelectronic components, and materials for energy among others. The employed techniques
include diffraction methods (such as coherent X-ray diffraction imaging and Laue microdiffraction),
spectroscopy techniques (e.g. X-ray excited optical luminescence and X-ray absorption) as well as
tomography. They cover fields ranging from crystallography over mechanical properties and
optoelectronics to microelectronics and biomineralization.
Future upgrades will even further improve the beam qualities and thus boost the research using
nanofocused hard X-ray beams. This symposium is aimed to address the most recent progresses in
using micro- and nanofocused hard X-ray beams to study the structural and physical properties at the
micro and nanoscale including industrial components..