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EB4 - Narrow Field High-Order AO Telescope attitude: 1.0 Telescope Limitations Tilt/image smear effects Tilt loop performance Higher order image quality effects Primary and Secondary (from EB 1) Self induced seeing Acquisition mirrors residuals On-axis imaging performance: Zenith 45 deg wavefront Strehl wavefront Strehl [nm] @2.2 microns [nm] @2.2 microns 0.98 64.94 0.97 53.28 2.0 Instrument Limitations Tilt/image smear effects Flexure relative to OIWFS Higher order image quality effects 0 0 50 17 10 62 17 10 32.02 32.02 25 20 3.0 AO System Fitting errors (DM/WFS to atm.&optics) Servo lag Anisoplantism Wavefront sensor noise Uncorrected internal optics Calibration errors 111.55 79.90 59.5 0 26.8 30 30 Totals: 140.88 Wavelength (microns) Strehl Totals: 0.99 0.7 1 1.2 1.6 2.2 25 20 0.90 0.95 0.20 0.43 0.58 0.74 0.85 126.62 99.875 59.5 0 26.8 30 30 .88 0.92 157.53 FWHM [arcsec] Strehl 0.99 FWHM [arcsec] Strehl 0.14 0.38 0.51 0.68 0.82 Notes: Errors allocated in terms of rms wavefront error (or surface if noted) Rms errors added in quadrature Strehls calculated from following approximation: Strehl = S = exp[ -(2*PI*wvf_RMS/lambda)^2] (considered good for strehls above 0.2)