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EB4 - Narrow Field High-Order AO
Telescope attitude:
1.0 Telescope Limitations
Tilt/image smear effects
Tilt loop performance
Higher order image quality effects
Primary and Secondary (from EB 1)
Self induced seeing
Acquisition mirrors residuals
On-axis imaging performance:
Zenith
45 deg
wavefront
Strehl
wavefront
Strehl
[nm]
@2.2 microns
[nm]
@2.2 microns
0.98
64.94
0.97
53.28
2.0 Instrument Limitations
Tilt/image smear effects
Flexure relative to OIWFS
Higher order image quality effects
0
0
50
17
10
62
17
10
32.02
32.02
25
20
3.0 AO System
Fitting errors (DM/WFS to atm.&optics)
Servo lag
Anisoplantism
Wavefront sensor noise
Uncorrected internal optics
Calibration errors
111.55
79.90
59.5
0
26.8
30
30
Totals:
140.88
Wavelength (microns)
Strehl Totals:
0.99
0.7
1
1.2
1.6
2.2
25
20
0.90
0.95
0.20
0.43
0.58
0.74
0.85
126.62
99.875
59.5
0
26.8
30
30
.88
0.92
157.53
FWHM
[arcsec]
Strehl
0.99
FWHM
[arcsec]
Strehl
0.14
0.38
0.51
0.68
0.82
Notes:
Errors allocated in terms of rms wavefront error (or surface if noted)
Rms errors added in quadrature
Strehls calculated from following approximation: Strehl = S = exp[ -(2*PI*wvf_RMS/lambda)^2]
(considered good for strehls above 0.2)
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