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Chapter 3 Solid-State Diodes and Diode Circuits Microelectronic Circuit Design Richard C. Jaeger Travis N. Blalock Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -1 Chapter Goals • Understand diode structure and basic layout • Develop electrostatics of the pn junction • Explore various diode models including the mathematical model, the ideal diode model, and the constant voltage drop model • Understand the SPICE representation and model parameters for the diode • Define regions of operation of the diode (forward, reverse bias, and reverse breakdown) • Apply the various types of models in circuit analysis • Explore different types of diodes Discuss the dynamic switching behavior of the pn junction diode • Explore diode applications • Practice simulating diode circuits using SPICE Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -2 Diode Introduction • A diode is formed by interfacing an n-type semiconductor with a p-type semiconductor. • A pn junction is the interface between n and p regions. Diode symbol Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -3 pn Junction Electrostatics Donor and acceptor concentration on either side of the junction. Concentration gradients give rise to diffusion currents. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -4 Drift Currents • Diffusion currents lead to localized charge density variations near the pn junction. • Gauss’ law predicts an electric field due to the charge distribution: c E s • Assuming constant permittivity, 1 E(x) s (x)dx • Resulting electric field gives rise to a drift current. With no external circuit connections, drift and diffusion currents cancel. There is no actual current, since this would imply power dissipation, rather the electric field cancels the diffusion current ‘tendency.’ Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -5 Space Charge Region Formation at the pn Junction Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -6 Potential across the Junction Charge Density Electric Field Potential N N kT A D j E(x)dx VT ln 2 , VT q n i Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -7 Width of Depletion Region Combining the previous expressions, we can form an expression for the width of the space-charge region, or depletion region. It is called the depletion region since the excess holes and electrons are depleted from the dopant atoms on either side of the junction. 2 s 1 1 wd 0 (x n x p ) j q N A N D Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -8 Width of Depletion Region (Example) Problem: Find built-in potential and depletion-region width for given diode Given data:On p-type side: NA=1017/cm3 on n-type side: ND=1020/cm3 Assumptions: Room-temperature operation with VT=0.025 V Analysis: N AN D 1017 /cm 3 1020 /cm 3 0.979V j VT ln 2 (0.025 V)ln 20 6 10 /cm ni 2 s 1 1 w q 0.113m N j d0 N D A Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -9 Diode Electric Field (Example) • Problem: Find electric field and size of individual depletion layers on either side of pn junction for given diode • Given data:On p-type side: NA=1017/cm3 on n-type side: ND=1020/cm3 from earlier example, j 0.979V wd 0 0.113m • Assumptions: Room-temperature operation N N • Analysis: D A w x x x 1 x 1 d0 n p n N A p N D w w d 0 0.113m d 0 1.1310-4 m x xn p N N 1 A 1 D N N A D 2 E w j 2(0.979V) 173kV/cm MAX d 0 0.113m Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -10 Internal Diode Currents Mathematically, for a diode with no external connections, the total current expressions developed in chapter 2 are equal to zero. The equations only dictate that the total currents are zero. However, as mentioned earlier, since there is no power dissipation, we must assume that the field and diffusion current tendencies cancel and the actual currents are zero. n =0 x p T j p q p pE qDp =0 x j nT q n nE qDn When external bias voltage is applied to the diode, the above equations are no longer equated to zero. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -11 Diode Junction Potential for Different Applied Voltages Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -12 Diode i-v Characteristics Turn-on voltage marks point of significant current flow. Is is called the reverse saturation current. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -13 Diode Equation v qv D i D I S exp 1 I S exp D nkT nVT = reverse saturation current (A) vD = voltage applied to diode (V) q = electronic charge (1.60 x 10-19 C) k = Boltzmann’s constant (1.38 x 10-23 J/K) T = absolute temperature n = nonideality factor (dimensionless) VT = kT/q = thermal voltage (V) (25 mV at room temp.) IS is typically between 10-18 and 10-9 A, and is strongly temperature dependent due to its dependence on ni2. The nonideality factor is typically close to 1, but approaches 2 for devices with high current densities. It is assumed to be 1 in this text. where 1 IS Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -14 Diode Voltage and Current Calculations (Example) Problem: Find diode voltage for diode with given specifications Given data: IS=0.1 fA ID= 300 A Assumptions: Room-temperature dc operation with VT=0.025 V Analysis: I -4 A ) 0.718V With IS=0.1 fA VD nVT ln 1 ID 1(0.0025V)ln(1 310 16 10 A S With IS=10 fA VD 0.603V With ID= 1 mA, IS=0.1 fA V 0.748V D Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -15 Diode Current for Reverse, Zero, and Forward Bias • Reverse bias: • Zero bias: v i D I S exp D nVT 1 I S 0 1 I S v i D I S exp D 1 I S 11 0 nVT • Forward bias: Jaeger/Blalock 7/1/03 v v D i D I S exp 1 I S exp D nVT nVT Microelectronic Circuit Design McGraw-Hill Chap 3 -16 Semi-log Plot of Diode Current and Current for Three Different Values of IS I S [ A] 10I S [B] 100 I S [C] Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -17 Diode Temperature Coefficient Diode voltage under forward bias: i kT i kT i D D v D VT ln 1 ln 1 ln D I S q I S q I S Taking the derivative with respect to temperature yields dvD k i D kT 1 dI S v D 1 dI S v D VGO 3VT ln VT V/K I S dT T dT q I S q I S 2dT T Assuming iD >> IS, IS ni , and VGO is the silicon bandgap energy at 0K. For a typical silicon diode dvD 0.65 1.12 0.075V = -1.82 mV/K - 1.8 mV/ C dT 300K Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -18 Reverse Bias External reverse bias adds to the built-in potential of the pn junction. The shaded regions below illustrate the increase in the characteristics of the space charge region due to an externally applied reverse bias, vD. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -19 Reverse Bias (cont.) External reverse bias also increases the width of the depletion region since the larger electric field must be supported by additional charge. 2 s 1 1 w d (x n x p ) j v R q N A N D wd wd 0 vR 1 j 2 s 1 1 where wd 0 (x n x p ) j q N A N D Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -20 Reverse Bias Saturation Current We earlier assumed that reverse saturation current was constant. Since it results from thermal generation of electron-hole pairs in the depletion region, it is dependent on the volume of the space charge region. It can be shown that the reverse saturation gradually increases with increased reverse bias. I S I S0 1 vR j IS is approximately constant at IS0 under forward bias. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -21 Reverse Breakdown Increased reverse bias eventually results in the diode entering the breakdown region, resulting in a sharp increase in the diode current. The voltage at which this occurs is the breakdown voltage, VZ. 2 V < VZ < 2000 V Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -22 Reverse Breakdown Mechanisms • Avalanche Breakdown Si diodes with VZ greater than about 5.6 volts breakdown according to an avalanche mechanism. As the electric field increases, accelerated carriers begin to collide with fixed atoms. As the reverse bias increases, the energy of the accelerated carriers increases, eventually leading to ionization of the impacted ions. The new carriers also accelerate and ionize other atoms. This process feeds on itself and leads to avalanche breakdown. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -23 Reverse Breakdown Mechanisms (cont.) • Zener Breakdown Zener breakdown occurs in heavily doped diodes. The heavy doping results in a very narrow depletion region at the diode junction. Reverse bias leads to carriers with sufficient energy to tunnel directly between conduction and valence bands moving across the junction. Once the tunneling threshold is reached, additional reverse bias leads to a rapidly increasing reverse current. • Breakdown Voltage Temperature Coefficient Temperature coefficient is a quick way to distinguish breakdown mechanisms. Avalanche breakdown voltage increases with temperature, zener breakdown decreases with temperature. For silicon diodes, zero temperature coefficient is achieved at approximately 5.6 V. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -24 Breakdown Region Diode Model In breakdown, the diode is modeled with a voltage source, VZ, and a series resistance, RZ. RZ models the slope of the i-v characteristic. Diodes designed to operate in reverse breakdown are called Zener diodes and use the indicated symbol. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -25 Reverse Bias Capacitance Changes in voltage lead to changes in depletion width and charge. This leads to a capacitance that we can calculate from the charge voltage dependence. N N Qn qN D x n A q A D w d A Coulombs N A N D C j0A dQn Cj dv R v 1 R F/cm 2 where C j 0 s wd 0 j Cj0 is the zero bias junction capacitance per unit area. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -26 Reverse Bias Capacitance (cont.) Diodes can be designed with hyper-abrupt doping profiles that optimize the reverse-biased diode as a voltage controlled capacitor. Circuit symbol for the variable capacitance diode (varactor) Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -27 Forward Bias Capacitance In forward bias operation, additional charge is stored in neutral region near edges of space charge region. QD iD T Coulombs T is called diode transit time and depends on size and type of diode. Additional diffusion capacitance, associated with forward region of operation is proportional to current and becomes quite large at high currents. dQD iD I S T iD T Cj F dvD VT VT Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -28 Schottky Barrier Diode One semiconductor region of the pn junction diode is replaced by a nonohmic rectifying metal contact.A Schottky contact is easily added to n-type silicon,metal region becomes anode. n+ region is added to ensure that cathode contact is ohmic. Jaeger/Blalock 7/1/03 Schottky diode turns on at lower voltage than pn junction diode, has significantly reduced internal charge storage under forward bias. Microelectronic Circuit Design McGraw-Hill Chap 3 -29 Diode Spice Model Rs is inevitable series resistance of a real device structure. Current controlled current source represents ideal exponential behavior of diode. Capacitor specification includes depletion-layer capacitance for reverse-bias region as well as diffusion capacitance associated with junction under forward bias. Typical default values: Saturation current= 10 fA, Rs = 0W, Transit time= 0 second Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -30 Diode Layout Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -31 Diode Circuit Analysis: Basics Loop equation for given circuit is: V I D R VD V and R may represent Thevenin equivalent of a more complex 2terminal network.Objective of diode circuit analysis is to find quiescent operating point for diode, consisting of dc current and voltage that define diode’s i-v characteristic. Jaeger/Blalock 7/1/03 This is also called the load line for the diode. Solution to this equation can be found by: • Graphical analysis using load-line method. • Analysis with diode’s mathematical model. • Simplified analysis with ideal diode model. • Simplified analysis using constant voltage drop model. Microelectronic Circuit Design McGraw-Hill Chap 3 -32 Load-Line Analysis (Example) Problem: Find Q-point Given data: V=10 V, R=10kW. Analysis: 10 I 104 V D D To define the load line we use, VD= 0 I D (10V / 10kW) 1mA VD= 5 V, ID =0.5 mA These points and the resulting load line are plotted.Q-point is given by intersection of load line and diode characteristic: Q-point = (0.95 mA, 0.6 V) Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -33 Analysis using Mathematical Model for Diode Problem: Find Q-point for given diode characteristic. Given data: IS =10-13 A, n=1, VT =0.0025 V Analysis: VD 1 1013exp 40VD 1 I D I S exp nVT 10 1041013exp 40VD 1 VD is load line, given by a transcendental equation. A numerical answer can be found by using Newton’s iterative method. f 10 1041013exp 40VD 1 VD Jaeger/Blalock 7/1/03 •Make initial guess VD0 . •Evaluate f and its derivative f’ for this value of VD. •Calculate new guess for0 VD using f VD 1 0 VD VD 0 f ' (VD ) •Repeat steps 2 and 3 till convergence. Using a spreadsheet we get : Q-point = ( 0.9426 mA, 0.5742 V) Since, usually we don’t have accurate saturation current and significant tolerances for sources and passive components, we need answers precise up to only 2or 3 significant digits. Microelectronic Circuit Design McGraw-Hill Chap 3 -34 Analysis using Ideal Model for Diode If diode is forward-biased, voltage across diode is zero. If diode is reverse-biased, current through diode is zero. vD =0 for iD >0 and vD =0 for vD < 0 Thus diode is assumed to be either on or off. Analysis is conducted in following steps: • Select diode model. • Identify anode and cathode of diode and label vD and iD. • Guess diode’s region of operation from circuit. • Analyze circuit using diode model appropriate for assumed operation region. • Check results to check consistency with assumptions. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -35 Analysis using Ideal Model for Diode: Example Since source is forcing positive current through diode assume diode is on. (10 0)V ID 1mA 10kW I D 0 our assumption is right. Q-point is(1 mA, 0V) Jaeger/Blalock 7/1/03 Since source is forcing current backward through diode assume diode is off. Hence ID =0 . Loop equation is: 10 VD 104 I D 0 VD 10V our assumption is right. Q-point is (0, -10 V) Microelectronic Circuit Design McGraw-Hill Chap 3 -36 Analysis using Constant Voltage Drop Model for Diode Analysis: vD = Von for iD >0 and vD = 0 for vD < Von. Jaeger/Blalock 7/1/03 Since 10V source is forcing positive current through diode assume diode is on. (10 Von ) V ID 10kW (10 0.6) V 0.94mA 10kW Microelectronic Circuit Design McGraw-Hill Chap 3 -37 Two-Diode Circuit Analysis Analysis: Ideal diode model is chosen. Since 15V source is forcing positive current through D1 and D2 and -10V source is forcing positive current through D2, assume both diodes are on. Since voltage at node D is zero due to short circuit of ideal diode D1, (15 0) V 1.50mA I D2 0 (10)V 2.00mA 5kW 10kW I I I I 1.5 2 0.50mA 1 D1 D2 D1 I1 Q-points are (-0.5 mA, 0 V) and (2.0 mA, 0 V) But, ID1 <0 is not allowed by diode, so try again. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -38 Two-Diode Circuit Analysis (contd.) Since current in D1 is zero, ID2 = I1, 1510,000I 5,000I (10) 0 1 D2 25V I 1.67mA 1 15,000W V 1510,000I 1516.7 1.67V D1 1 Analysis: Since current in D2 but that in D1 is invalid, the second guess is D1 off and D2 on. Jaeger/Blalock 7/1/03 Q-points are D1 : (0 mA, -1.67 V):off D2 : (1.67 mA, 0 V) :on Microelectronic Circuit Design McGraw-Hill Chap 3 -39 Analysis of Diodes in Reverse Breakdown Operation Choose 2 points (0V, -4 mA) and (-5 V, -3 mA) to draw the load line.It intersects with i-v characteristic at Q-point (-2.9 mA, -5.2 V). Using piecewise linear model: I I 0 Z D Using load-line analysis: 20 V 5000I D D Jaeger/Blalock 7/1/03 20 5100I 5 0 Z (20 5)V I 2.94mA Z 5100W Since IZ >0 (ID <0), solution is consistent with Zener breakdown assumption. Microelectronic Circuit Design McGraw-Hill Chap 3 -40 Voltage Regulator using Zener Diode V V (20 5)V I S Z 3mA S R 5kW V 5V I Z 1mA L R 5kW L I I I 2mA Z S L For proper regulation, Zener current must be positive. If Zener current <0, Zener diode no longer controls voltage across load resistor and voltage regulator is said to have Zener diode keeps voltage “dropped out of regulation”. across load resistor constant. R R V R For Zener breakdown I S V 1 1 0 L VS min Z R ZR R 1 operation, IZ >0. L V Z Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -41 Voltage Regulator using Zener Diode: Example (Including Zener Resistance) V 20V V 5V V Z L L 0 5000W 100W 5000W V 5.19V L Problem: Find output voltage and Zener diode current for Zener diode regulator. Given data: VS=20 V, R=5 kW, RZ= 0.1 kW,VZ=5 V Analysis: Output voltage is a function of current through Zener diode. Jaeger/Blalock 7/1/03 V 5V 5.19V 5V I L 1.9mA 0 Z 100W 100W Microelectronic Circuit Design McGraw-Hill Chap 3 -42 Line and Load Regulation Line regulation characterizes how sensitive output voltage is to input voltage changes. dV Line Regulation L mV/V dV R S Z For fixed load current, Line regulation = RR Z Load regulation characterizes how sensitive output voltage is to changes in load current withdrawn from regulator. dV Load Regulation L Ohms dI L For changes in load current, Load regulation = ( RZ R) Load regulation is Thevenin equivalent resistance looking back into regulator from load terminals. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -43 Rectifier Circuits • Basic rectifier converts an ac voltage to a pulsating dc voltage. • A filter then eliminates ac components of the waveform to produce a nearly constant dc voltage output. • Rectifier circuits are used in virtually all electronic devices to convert the 120 V-60 Hz ac power line source to the dc voltages required for operation of the electronic device. • In rectifier circuits, the diode state changes with time and a given piecewise linear model is valid only for a certain time interval. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -44 Half-Wave Rectifier Circuit with Resistive Load For positive half-cycle of input, source forces positive current through diode, diode is on, vo = vs. During negative half cycle, negative current can’t exist in diode, diode is off, current in resistor is zero and vo =0 . Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -45 Half-Wave Rectifier Circuit with Resistive Load (contd.) Using CVD model, during on state of diode vo =(VP sinwt)- Von. Output voltage is zero when diode is off. Often a step-up or step-down transformer is used to convert 120 V-60 Hz voltage available from power line to desired ac voltage level as shown. Time-varying components in circuit output are removed using filter capacitor. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -46 Peak Detector Circuit As input voltage rises, diode is on and capacitor (initially discharged) charges up to input voltage minus the diode voltage drop. At peak of input, diode current tries to reverse, diode cuts off, capacitor has no discharge path and retains constant voltage providing constant output voltage Vdc = VP - Von. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -47 Half-Wave Rectifier Circuit with RC Load As input voltage rises during first quarter cycle, diode is on and capacitor (initially discharged) charges up to peak value of input voltage. At peak of input, diode current tries to reverse, diode cuts off, capacitor discharges exponentially through R. Discharge continues till input voltage exceeds output voltage which occurs near peak of next cycle. Process then repeats once every cycle. This circuit can be used to generate negative output voltage if the top plate of capacitor is grounded instead of bottom plate. In this case, Vdc = -(VP - Von) Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -48 Half-Wave Rectifier Circuit with RC Load (contd.) Output voltage is not constant as in ideal peak detector, but has ripple voltage Vr. Diode conducts for a short time DT called conduction interval during each cycle and its angular equivalent is called conduction angle θc. T DT (VP Von ) T Vr (V Von) 1 P RC T R C 1 DT w 2T (VP Von ) 1 2Vr w V RC V P P c wDT Jaeger/Blalock 7/1/03 2Vr V P Microelectronic Circuit Design McGraw-Hill Chap 3 -49 Half-Wave Rectifier Analysis: Example Problem: Find dc output voltage, output current, ripple voltage, conduction interval, conduction angle. Given data: secondary voltage Vrms 12.6 (60 Hz), R= 15 W, C= 25,000 F, Von = 1 V Analysis: V V V (12.6 2 1)V 16.8V dc P on V Von 16.8V I P 1.12A R dc 15W (V V ) Using discharge interval T=1/60 s, V P on T 0.747V r R C 2Vr c wDT 0.290rad 16.60 V P DT wc c 0.29 0.769ms 2f 120 Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -50 Peak Diode Current In rectifiers, nonzero current exists in diode for only a very small fraction of period T, yet an almost constant dc current flows out of filter capacitor to load. Total charge lost from capacitor in each cycle is replenished by diode during short conduction interval causing high peak diode currents. If repetitive current pulse is modeled as triangle of height IP and width DT, I I 2T 48.6A P dc DT using values from previous example. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -51 Surge Current Besides peak diode currents, when power supply is turned on, there is an even larger current through diode called surge current. During first quarter cycle, current through diode is approximately d i (t) ic(t) C V sinwt wCV coswt P d P dt Peak values of this initial surge current occurs at t = 0+: I wCV 168A P SC using values from previous example. Actual values of surge current won’t be as large as predicted because of neglected series resistance associated with rectifier diode as well as transformer. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -52 Peak Inverse Voltage Rating Peak inverse voltage (PIV) rating of the rectifier diode gives the breakdown voltage. When diode is off, reverse-bias across diode is Vdc - vs. When vs reaches negative peak, PIV V vsmin V Von (V ) 2V P P P dc PIV value corresponds to minimum value of Zener breakdown voltage for rectifier diode. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -53 Diode Power Dissipation Average power dissipation in diode is given by I DT 1T 1T P v (t )i (t )dt Voni (t )dt Von P D T D D 2 T D T 0 0 Von I dc The simplification is done by assuming the triangular approximation of diode current and that voltage across diode is constant at Vdc. Average power dissipation in the diode series resistance is given by 1T 2 1 4 P i (t )R dt I 2R DT T I 2R D T D P S T 3 DT dc S S 3 0 This power dissipation can be reduced by minimizing peak current through use of minimum required size of filter capacitor or using fullwave rectifiers. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -54 Full-Wave Rectifiers Full-wave rectifiers cut capacitor discharge time in half and require half the filter capacitance to achieve given ripple voltage. All specifications are same as for half-wave rectifiers. Reversing polarity of diodes gives a fullwave rectifier with negative output voltage. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -55 Full-Wave Bridge Rectification Requirement for a center-tapped transformer in the full-wave rectifier is eliminated through use of 2 extra diodes.All other specifications are same as for a half-wave rectifier except PIV=VP. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -56 Rectifier Topology Comparison • Filter capacitor is a major factor in determining cost, size and weight in design of rectifiers. • For given ripple voltage, full-wave rectifier requires half the filter capacitance as that in half-wave rectifier. Reduced peak current can reduce heat dissipation in diodes. Benefits of full-wave rectification outweigh increased expenses and circuit complexity (a extra diode and center-tapped transformer). • Bridge rectifier eliminates center-tapped transformer, PIV rating of diodes is reduced. Cost of extra diodes is negligible. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -57 Rectifier Design Analysis Problem: Design rectifier with given specifications. Given data: Vdc =15 V, Vr < 0.15 V, Idc = 2 A Analysis: Use full-wave bridge rectifier that needs smaller value of filter capacitance, smaller diode PIV rating and no center-tapped transformer. V 2Von 15 2 P V dc V 12Vrms 2 2 2 V 1 T / 2 1 CI 2 A s 0.111F dc V 120 0.15V r 1 2Vr 1 2(0.15V) 0.352ms w V 120 17V P 1/60s 2 T 2A I I 94.7A I surge wCV 120 (0.111)(17) 711A P P dc DT 2 0.352ms DT PIV V 17V P Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -58 Three-terminal IC Voltage Regulators • Uses feedback with high-gain amplifier to reduce ripple voltage at output.Bypass capacitors provide low-impedance path for high-frequency signals to ensure proper operation of regulator. • Provides excellent line and load regulation, maintaining constant voltage even if output current changes by many orders of magnitude. • Main design constraint is VREG which must not fall below a minimum specified “dropout” voltage (a few volts). Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -59 DC-to-DC converters: Boost Converter When switch is closed, diode is off: Ton V V i (Ton ) i (0 ) S dt i (0 ) S Ton L L L L L 0 When switch is open, diode is on: V V Vo S i (T ) i (0 ) Ton S T L L L L off Jaeger/Blalock 7/1/03 i (T ) i (0 ) L L Vs Vo 1 where = Ton/T is duty cycle Since 0<<1, Vo > VS. Microelectronic Circuit Design McGraw-Hill Chap 3 -60 DC-to-DC converters: Boost Converter (contd.) V Vo V S ST Ripple current is given by Ir Ton or Ir off L L V V T T V L S Ton S on S Ir I r T I r f In ideal converter, power delivered to input of converter is same as power delivered to load resistor. Vo Io T V I Vo Io or I S Io Io S S V T 1 S off Ripple voltage is given as VoTon VoT Ton VoT Vr Ton C RC RC T RC Io Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -61 DC-to-DC converters: Buck Converter When switch is closed, diode is off: Ton V V V Vo o S i (Ton) i (0 ) dt i (0 ) S Ton L L L L L 0 i (T ) i (0 ) L L When switch is open, diode is on: T Vo Vs on Vs T V Vo V i (T ) i (0 ) S Ton o T where is switch duty cycle L L L L off Since 0<<1, Vo < VS. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -62 DC-to-DC converters: Buck Converter (contd.) Vo I T Ripple current is given by r L off Vo VoT Toff Vo L T off Ir I r T I r f V V o Ton or Ir S L In ideal converter, power delivered to input of converter is same as power Vo Ton delivered to load resistor. I Io Io Io S V T S Ripple voltage is given as Ton (T / 2) I Ton T I rT 1 off off 1 DQ r D Q Vr ir dt 2 2 2 8 C C Ton / 2 I rT Vo T 2 C (1 ) 8Vr Vr 8L Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -63 Clamping or DC-Restoring Circuit After the initial transient lasting less than one cycle in both circuits, output waveform is an undistorted replica of input. Both waveforms are clamped to zero. Their dc levels are said to be restored by the clamping circuit. Clamping level can also be shifted away from zero by adding a voltage source in series with diode. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -64 Clipping or Limiting Circuits Clipping circuits have dc path between input and output, whereas clamping circuits use capacitive coupling between input and output. The voltage transfer characteristic shows that gain is unity for vI < VC, and gain is zero for vI > VC. A second clipping level can also be set as shown or diodes can be used to control circuit gain by switching resistors in and out of circuits. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -65 Dynamic Switching Behavior of Diode Non-linear depletion-layer capacitance of diode prevents voltage from changing instantaneously and determines turn-on and recovery times. Both forward and reverse current overshoot final value when diode switches on and off as I shown. Storage time is given by: ln1 F S T I R Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -66 Photo Diodes and Photodetectors If depletion region of pn junction diode is illuminated with light with sufficiently high frequency, photons can provide enough energy to cause electrons to jump the semiconductor bandgap to generate electron-hole pairs: hc E h E P G h =Planck’s constant= 6.626e-34 J.s υ = frequency of optical illumination = wavelength of optical illumination c =velocity of light=3e+8m/s Photon-generated current can be used in photodetector circuits to generate output voltage vo i R PH Diode is reverse-biased to enhance depletion-region width and electric field. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -67 Solar Cells and Light-Emitting Diodes In solar cell applications, optical illumination is constant, dc current IPH is generated. Aim is to extract power from cell, i-v characteristics are plotted in terms of cell current and cell voltage. For solar cell to supply power to external circuit, ICVC product must be positive and cell should be operated near point of maximum output power Pmax. Light-Emitting Diodes use recombination process in forward-biased pn junction diode. When a hole and electron recombine, energy equal to bandgap of semiconductor is released as a photon. Jaeger/Blalock 7/1/03 Microelectronic Circuit Design McGraw-Hill Chap 3 -68