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Lumped and Distributed Parameter SPICE Models of TE Devices Considering Temperature
Lumped and Distributed Parameter SPICE Models of TE Devices Considering Temperature

PDF
PDF

HC9
HC9

2-e-2-1 - University of Nevada, Reno
2-e-2-1 - University of Nevada, Reno

Understanding Temperature Specifications: An Introduction
Understanding Temperature Specifications: An Introduction

... ©Cypress Semiconductor Corporation, 2007-2017. This document is the property of Cypress Semiconductor Corporation and its subsidiaries, including Spansion LLC (“Cypress”). This document, including any software or firmware included or referenced in this document (“Software”), is owned by Cypress unde ...
Varistors SMOV25S Datasheet
Varistors SMOV25S Datasheet

Fast Track Troubleshooting
Fast Track Troubleshooting

Use of thermodynamic entropy as thermal charge
Use of thermodynamic entropy as thermal charge

Thermal path integrity monitoring for IGBT power
Thermal path integrity monitoring for IGBT power

Conflict Minerals in Your Daily Digital Life
Conflict Minerals in Your Daily Digital Life

WHM2025AE
WHM2025AE

... The SN63 solder paste can be dispensed by a needle manually or driven by a compressed air. Figure 2 shows the example of the dispensed solder paste pattern. Each solder paste dot is in the diameter of 0.005” ~ 0.010” (0.125 ~ 0.250 mm). For volume assembly, a stencil with 0.004” (0.10 mm) is recomme ...
TV-B-Gone KIT
TV-B-Gone KIT

chemicals
chemicals

HV Capacitor Reliability Information, doc
HV Capacitor Reliability Information, doc

... equation that is used by the industry to calculate reliability information at a user selected operating point based on test data obtained at max. voltage and temperature. This so called PV equation (Prokopoviz and Vaskas) is used predict lifetime at a given temperature and voltage if you have known ...
Package Dimensions Features Applications Application Note Part
Package Dimensions Features Applications Application Note Part

Thermal detectors
Thermal detectors

... Typical values of τth are of order 10 ms, τe can vary in a range 10-12 – 100 s. ...
Varistors SMOV34S Datasheet
Varistors SMOV34S Datasheet

IN-SITU CHARACTERIZATION OF SPUTTERED PD THIN-FILMS UNDERGOING ELECTROLYSIS
IN-SITU CHARACTERIZATION OF SPUTTERED PD THIN-FILMS UNDERGOING ELECTROLYSIS

High-Voltage, High-Current OPERATIONAL AMPLIFIER OPA544
High-Voltage, High-Current OPERATIONAL AMPLIFIER OPA544

... Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant ...
Functional Description Product Specification
Functional Description Product Specification

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PRODUCT SPECIFICATIONS Multi-Stage Heat

Design methodology for repetitive voltage suppressors (RVS) in
Design methodology for repetitive voltage suppressors (RVS) in

... Junction-to-ambient thermal resistance (Rth(j-a)) The thermal resistance Rth(j-a) is the heat dissipation capability from the junction surface of the die to the ambient, via all paths. Its value is strongly dependent on the type of board, the copper plane underneath the device, the neighboring compo ...
6. Thermal Properties
6. Thermal Properties

... larger. In insulators, on the other hand, heat is transmitted entirely by phonons, since there are no mobile electrons in these substances. Here we consider only transmission by phonons. When we discuss transmission of heat by phonons, it is convenient to think of these as forming a phonon gas. In e ...
Analysis of the Thermal Load of Structural Elements High
Analysis of the Thermal Load of Structural Elements High

T210 T260 - Viconics
T210 T260 - Viconics

< 1 ... 29 30 31 32 33 34 35 36 37 ... 41 >

Thermal copper pillar bump



The thermal copper pillar bump, also known as the ""thermal bump"", is a thermoelectric device made from thin-film thermoelectric material embedded in flip chip interconnects (in particular copper pillar solder bumps) for use in electronics and optoelectronic packaging, including: flip chip packaging of CPU and GPU integrated circuits (chips), laser diodes, and semiconductor optical amplifiers (SOA). Unlike conventional solder bumps that provide an electrical path and a mechanical connection to the package, thermal bumps act as solid-state heat pumps and add thermal management functionality locally on the surface of a chip or to another electrical component. The diameter of a thermal bump is 238 μm and 60 μm high.The thermal bump uses the thermoelectric effect, which is the direct conversion of temperature differences to electric voltage and vice versa. Simply put, a thermoelectric device creates a voltage when there is a different temperature on each side, or when a voltage is applied to it, it creates a temperature difference. This effect can be used to generate electricity, to measure temperature, to cool objects, or to heat them.For each bump, thermoelectric cooling (TEC) occurs when a current is passed through the bump. The thermal bump pulls heat from one side of the device and transfers it to the other as current is passed through the material. This is known as the Peltier effect. The direction of heating and cooling is determined by the direction of current flow and the sign of the majority electrical carrier in the thermoelectric material. Thermoelectric power generation (TEG) on the other hand occurs when the thermal bump is subjected to a temperature gradient (i.e., the top is hotter than the bottom). In this instance, the device generates current, converting heat into electrical power. This is termed the Seebeck effect.The thermal bump was developed by Nextreme Thermal Solutions as a method for integrating active thermal management functionality at the chip level in the same manner that transistors, resistors and capacitors are integrated in conventional circuit designs today. Nextreme chose the copper pillar bump as an integration strategy due to its widespread acceptance by Intel, Amkor and other industry leaders as the method for connecting microprocessors and other advanced electronics devices to various surfaces during a process referred to as “flip-chip” packaging. The thermal bump can be integrated as a part of the standard flip-chip process (Figure 1) or integrated as discrete devices.The efficiency of a thermoelectric device is measured by the heat moved (or pumped) divided by the amount of electrical power supplied to move this heat. This ratio is termed the coefficient of performance or COP and is a measured characteristic of a thermoelectric device. The COP is inversely related to the temperature difference that the device produces. As you move a cooling device further away from the heat source, parasitic losses between the cooler and the heat source necessitate additional cooling power: the further the distance between source and cooler, the more cooling is required. For this reason, the cooling of electronic devices is most efficient when it occurs closest to the source of the heat generation.Use of the thermal bump does not displace system level cooling, which is still needed to move heat out of the system; rather it introduces a fundamentally new methodology for achieving temperature uniformity at the chip and board level. In this manner, overall thermal management of the system becomes more efficient. In addition, while conventional cooling solutions scale with the size of the system (bigger fans for bigger systems, etc.), the thermal bump can scale at the chip level by using more thermal bumps in the overall design.
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