AHS用スキャニングレーザレンジファインダー の試作及びそれを用いた
... is the lag on the driver’s reaction time caused by are achieved by sensors based on laser, microwaves driver distraction, fatigue or inattention. Thus, ac- ...
... is the lag on the driver’s reaction time caused by are achieved by sensors based on laser, microwaves driver distraction, fatigue or inattention. Thus, ac- ...
Aperture interference and the volumetric resolution of light field
... Light field photography Inspired by the 4D light field, a geometrical optics parametrization of the light rays emanating from a macroscopic scene [25], light field photography measures both spatial and angular information about the light entering a camera. There exist many schemes for recording a li ...
... Light field photography Inspired by the 4D light field, a geometrical optics parametrization of the light rays emanating from a macroscopic scene [25], light field photography measures both spatial and angular information about the light entering a camera. There exist many schemes for recording a li ...
A Brief History of the Microscope and its Significance
... How does a slide projector differ from a microscope? A slide projector magnifies the image on the slide; hence, it projects a small image into a larger image on a screen. A slide projector does not increase the resolution of the object. A microscope also provides a magnified image for the observer, ...
... How does a slide projector differ from a microscope? A slide projector magnifies the image on the slide; hence, it projects a small image into a larger image on a screen. A slide projector does not increase the resolution of the object. A microscope also provides a magnified image for the observer, ...
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... which can be applied in more tech areas. For instance, it can make GaAs1−xBix a promising new semiconductor saturable absorber that has a very high possibility to be used in all-solid-state Q-switched and mode-locked lasers. In this paper, GaAs1−xBix crystal with different concentrations of Bi atoms ...
... which can be applied in more tech areas. For instance, it can make GaAs1−xBix a promising new semiconductor saturable absorber that has a very high possibility to be used in all-solid-state Q-switched and mode-locked lasers. In this paper, GaAs1−xBix crystal with different concentrations of Bi atoms ...
Special Optical Elements
... zinc sulfide (RI = 2.35), zinc selenide (RI = 2.67), and sodium aluminum fluoride, or cryolite, was used for the low-index material. Because these materials are both soft and hygroscopic, they must be protected, usually by sticking the coated sides of two glass substrates together with epoxy [Fig. 3 ...
... zinc sulfide (RI = 2.35), zinc selenide (RI = 2.67), and sodium aluminum fluoride, or cryolite, was used for the low-index material. Because these materials are both soft and hygroscopic, they must be protected, usually by sticking the coated sides of two glass substrates together with epoxy [Fig. 3 ...
ATOMIC EMISSION SPECTROMETRY
... sources. The spectra derived from low-energy sources such as flames are simpler than those from electrical discharges, although the temperature of flames and furnaces (2000–4000 K) is inadequate to excite many of the elements. Nevertheless, flame emission spectrometry is widely used for the determinati ...
... sources. The spectra derived from low-energy sources such as flames are simpler than those from electrical discharges, although the temperature of flames and furnaces (2000–4000 K) is inadequate to excite many of the elements. Nevertheless, flame emission spectrometry is widely used for the determinati ...
Three-dimensional digitization of highly reflective and transparent
... inclination. Chen et al. [23] present a technique based on a combination of polarization and change of phase using structured light. The change of phase of the light patterns to higher frequency allows the separation of the reflection into its diffuse and specular components. Analyzing two polarized ...
... inclination. Chen et al. [23] present a technique based on a combination of polarization and change of phase using structured light. The change of phase of the light patterns to higher frequency allows the separation of the reflection into its diffuse and specular components. Analyzing two polarized ...
Optical field profile evaluation on silica high Optical field profile
... measureing method with a precition of 0.01 µm is, however, difficult because it is normally monitored through a lens system that degrades the precision in position. Here, we focus on the relation between NFP and far field pattern (FFP) using Fourier transformation. FFP is the angle component of the ...
... measureing method with a precition of 0.01 µm is, however, difficult because it is normally monitored through a lens system that degrades the precision in position. Here, we focus on the relation between NFP and far field pattern (FFP) using Fourier transformation. FFP is the angle component of the ...
Ray Optics - Sakshi Education
... definite direction. This is called reflection of light. The surface from which reflection takes place is called a reflector. The amount of light reflected depends on (i) the angle of incidence and (ii) the nature of the two media. 7. Laws of reflection : i) The incident ray, the normal to the reflec ...
... definite direction. This is called reflection of light. The surface from which reflection takes place is called a reflector. The amount of light reflected depends on (i) the angle of incidence and (ii) the nature of the two media. 7. Laws of reflection : i) The incident ray, the normal to the reflec ...
Sub-THz Electron Spin Resonance spectroscopy based on a Martin
... traverses two grids made of Au-coated W wire with 25 micron pitch,[55] which are at polar positions so as to transmit the incoming beam. When entering the MartinPuplett interferometer (MPI), the sub-THz beam is polarized in a linear plane 45◦ off the vertical axis. The computer-controlled interferom ...
... traverses two grids made of Au-coated W wire with 25 micron pitch,[55] which are at polar positions so as to transmit the incoming beam. When entering the MartinPuplett interferometer (MPI), the sub-THz beam is polarized in a linear plane 45◦ off the vertical axis. The computer-controlled interferom ...
Reflection and critical angle
... 2.4. Wave propagation at an interface - reflection and refraction Now, if we take the plane wave solution to the wave equation, we can determine what happens when a wave strikes a dielectric interface. We know from our discussion on ray optics that when a ray hits a mirror, the angle of reflection (wi ...
... 2.4. Wave propagation at an interface - reflection and refraction Now, if we take the plane wave solution to the wave equation, we can determine what happens when a wave strikes a dielectric interface. We know from our discussion on ray optics that when a ray hits a mirror, the angle of reflection (wi ...
Optical Damage Limits to Pulse Energy From Fibers - AS
... order modes. For example, the LP11 mode contains two lobes. If the power in each lobe can approach PSF , we could double the power limit. Modes with N lobes could transmit powers approaching N PSF . Computing the mode profiles using the iterative mode calculation method described earlier indicates t ...
... order modes. For example, the LP11 mode contains two lobes. If the power in each lobe can approach PSF , we could double the power limit. Modes with N lobes could transmit powers approaching N PSF . Computing the mode profiles using the iterative mode calculation method described earlier indicates t ...
Rate equation model of bulk optical damage of silica - AS
... polarization maintaining fiber. Damage thresholds were measured for both polarizations. The two damage thresholds were equal, and they were identical to the damage threshold of the unstressed fused silica within our experimental uncertainty of 2%. 3. Laser induced damage threshold in bulk fused sili ...
... polarization maintaining fiber. Damage thresholds were measured for both polarizations. The two damage thresholds were equal, and they were identical to the damage threshold of the unstressed fused silica within our experimental uncertainty of 2%. 3. Laser induced damage threshold in bulk fused sili ...
