"Contrast Enhancement in Light Microscopy". In: Current Protocols in
... enhancing or visualizing specific specimen features make this technique exceptionally useful in biomedical applications. In recent years, electronic imaging has both greatly enhanced the capabilities of light microscopes and placed ever-increasing demands on their optical performance. A number of pu ...
... enhancing or visualizing specific specimen features make this technique exceptionally useful in biomedical applications. In recent years, electronic imaging has both greatly enhanced the capabilities of light microscopes and placed ever-increasing demands on their optical performance. A number of pu ...
Laser Beam Profile, Spot size and Beam Divergence
... can do this by slowly adjusting the laser in it’s support while checking the intensity pattern along two virtual horizontal lines at different heights on the beam cross-section. After this is done, we fix a distance for the detector and take intensity measurements of the beam along a horizontal line ...
... can do this by slowly adjusting the laser in it’s support while checking the intensity pattern along two virtual horizontal lines at different heights on the beam cross-section. After this is done, we fix a distance for the detector and take intensity measurements of the beam along a horizontal line ...
A simple peak-to-average power ratio reduction
... (1). As aforementioned, | xn | reaches the maximum when n=0, and X k follows 0-1 distribution. Consequently, the maximum of | xn | can only be an integral number, varying from 1 to 16. Moreover, the expectation of | xn | is determined by X k , so that the average power of all optical OFDM symbols ch ...
... (1). As aforementioned, | xn | reaches the maximum when n=0, and X k follows 0-1 distribution. Consequently, the maximum of | xn | can only be an integral number, varying from 1 to 16. Moreover, the expectation of | xn | is determined by X k , so that the average power of all optical OFDM symbols ch ...
Polarization microscopy with the LC-PolScope
... then labeling them to detect specific molecular species. This role reversal was made possible by the many spectacular advances in fluorescence imaging and the development of many vital molecular probes, particularly the green fluorescent protein, which have seemingly outshined the more traditional t ...
... then labeling them to detect specific molecular species. This role reversal was made possible by the many spectacular advances in fluorescence imaging and the development of many vital molecular probes, particularly the green fluorescent protein, which have seemingly outshined the more traditional t ...
Measurement of seawater refractive index and salinity by means of
... Conductivity sensors will only detect the concentration of conductive materials in specific water samples. Other non-conductive materials in a water sample will not be detected, but will contribute to the overall density of the sample. A measurement of the refractive index of the water sample could ...
... Conductivity sensors will only detect the concentration of conductive materials in specific water samples. Other non-conductive materials in a water sample will not be detected, but will contribute to the overall density of the sample. A measurement of the refractive index of the water sample could ...
Laser ranging: a critical review of usual techniques
... The surface shape of objects can be imaged and digitized using the following basic components: a light source to define a specific pixel共s兲, such as an encoding-decoding process 共e.g., triangulation, fringe and pattern projections, and time of flight兲, a sensing device composed of a collecting lens ...
... The surface shape of objects can be imaged and digitized using the following basic components: a light source to define a specific pixel共s兲, such as an encoding-decoding process 共e.g., triangulation, fringe and pattern projections, and time of flight兲, a sensing device composed of a collecting lens ...
Optical microscopy laboratory practice 2012
... Fig 2. bright-field (left) or dark-field (right) illumination principle. [3] Microscope Parts and Functions [7] 1. Eyepiece: The eyepiece (sometimes called the 'ocular') is the lens of the microscope closest to the eye that you look through. It is half of the magnification equation (eyepiece power m ...
... Fig 2. bright-field (left) or dark-field (right) illumination principle. [3] Microscope Parts and Functions [7] 1. Eyepiece: The eyepiece (sometimes called the 'ocular') is the lens of the microscope closest to the eye that you look through. It is half of the magnification equation (eyepiece power m ...
Axial birefringence in high-numerical-aperture optical
... The information on optical disks is read out by focusing light of wavelength and numerical aperture (NA) on the information layer through a protective cover layer of thickness d. To increase the information density the wavelength is decreased and the numerical aperture is increased, as the spot si ...
... The information on optical disks is read out by focusing light of wavelength and numerical aperture (NA) on the information layer through a protective cover layer of thickness d. To increase the information density the wavelength is decreased and the numerical aperture is increased, as the spot si ...
A short introduction to light and electron microscopy
... It is useful to think of light as a probe that can be used to determine the structure of objects viewed under the microscope. Generally, the probes must have size dimensions that are similar to or smaller than the structures being examined (note: compare the probe size and resolution of electron mic ...
... It is useful to think of light as a probe that can be used to determine the structure of objects viewed under the microscope. Generally, the probes must have size dimensions that are similar to or smaller than the structures being examined (note: compare the probe size and resolution of electron mic ...
Performance of extended depth of field systems and
... system as generally as possible, in order to address all of these methods. The considered optical system is a stop combined to a phase function and an amplitude function. This model could represent a lens, as well as a more complex assembly. Note that this model could be considered as the best case, ...
... system as generally as possible, in order to address all of these methods. The considered optical system is a stop combined to a phase function and an amplitude function. This model could represent a lens, as well as a more complex assembly. Note that this model could be considered as the best case, ...
Ohmic Contacts With Ultra-Low Optical Loss on Heavily Doped n
... observed and its thickness was optimized to reach the minimal contact resistance. Compared with the conventional AuGeNi based n-type contacts [7], this approach shows lower optical loss in the telecommunication wavelength range due to the absence of Ni which has a high absorption coefficient and a h ...
... observed and its thickness was optimized to reach the minimal contact resistance. Compared with the conventional AuGeNi based n-type contacts [7], this approach shows lower optical loss in the telecommunication wavelength range due to the absence of Ni which has a high absorption coefficient and a h ...
Efficient output coupling of intracavity high harmonic generation
... Another proposed method for coupling harmonics out of the enhancement cavity is to drill a small hole in the curved mirror after the intracavity focus [14]. Since the harmonic light will diverge less than the fundamental light, most of the harmonic light will pass through the hole while most of the ...
... Another proposed method for coupling harmonics out of the enhancement cavity is to drill a small hole in the curved mirror after the intracavity focus [14]. Since the harmonic light will diverge less than the fundamental light, most of the harmonic light will pass through the hole while most of the ...
Ellipsometry of light scattering from multilayer coatings
... 633-nm wavelength as a function of the incidence angle ~i! on an opaque ~150-nm-thick! Al layer deposited on a glass substrate by electron-beam evaporation. As shown in this figure, the agreement between theory and experiment is rather successful because the sample was of low quality. The complex in ...
... 633-nm wavelength as a function of the incidence angle ~i! on an opaque ~150-nm-thick! Al layer deposited on a glass substrate by electron-beam evaporation. As shown in this figure, the agreement between theory and experiment is rather successful because the sample was of low quality. The complex in ...