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Laboratory stand "Electrical Measurements"
Laboratory stand "Electrical Measurements"

... One of the most basic tasks of a DMM is measuring voltage. AC voltage is usually created by a generator. Some devices convert AC to DC. Testing for proper supply voltage is usually the first step when troubleshooting a circuit. If there is no voltage present, or if it is too high or too low, the vol ...
Dual Wideband, High Output Current Operational Amplifier with
Dual Wideband, High Output Current Operational Amplifier with

The Root-Mean Square of a Periodic Waveform
The Root-Mean Square of a Periodic Waveform

... Diodes are used in many types of circuits. For example, they are used in rectifier circuits to convert AC to DC. Also, they are used in clipper circuits to select for transmission that part of a waveform that is either greater or less than some reference value. The Half-Wave Rectifier Consider the c ...
MAX8815A 1A, 97% Efficiency, 30µA Quiescent Current Step-Up Converter with True Shutdown
MAX8815A 1A, 97% Efficiency, 30µA Quiescent Current Step-Up Converter with True Shutdown

AC Circuit Theory and Representation of Complex Impedance Values
AC Circuit Theory and Representation of Complex Impedance Values

... in terms of the ratio between voltage E and current I. R = E / I While this is a well known relationship, it's use is limited to only one circuit element -the ideal resistor. An ideal resistor has several simplifying properties: · It follows Ohm's Law at all current and voltage levels. · It's resist ...
Low voltage CMOS 16-bit D-type latch (3-state
Low voltage CMOS 16-bit D-type latch (3-state

... While the nLE input is held at a high level, the nQ outputs will follow the data input precisely. When the nLE is taken low, the nQ outputs will be in a normal logic state (high or low logic level) and while high level the outputs will be in a high impedance state. Bus hold on data inputs is provide ...
Low Inductance Capacitor Array
Low Inductance Capacitor Array

... The terminations on LICA® devices need to provide interconnections between the part and the substrate that have low resistance and low inductance, as well as adequate mechanical strength. Other factors in the selection of an interconnection technique include interconnect density, reliability, therma ...
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Ohm`s Law and Equivalent Resistance

... Resistors Connected in parallel - A number of resistors are in parallel if the voltage across each resistor is the same. You can recognize two resistors in parallel by the fact that there are multiple paths for the current to take. In the diagram below the current I splits into two different current ...
Tantalum Hybrid Capacitors for High–Power Applications
Tantalum Hybrid Capacitors for High–Power Applications

... evaluated using EIS. The new capacitor incorporates a parallel pair of relatively thin positive electrodes, yielding an ESR of 0.005 ohms. Peak current was measured during discharge into low-resistance loads. Currents exceeding 2000A were reached. The capacitor electrical performance is similar to t ...
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AVOP-ELEKTRO-BER-003

... The voltage on the left side of the resistor R1 is +1 V. What is the voltage on the other side of R1? The V+ input of the OA1 is grounded, so its voltage is 0.0 V. The voltage difference between the V+ and V- inputs is zero. That is why the V- input seems to be grounded too. It is virtually grounded ...
voltage divider rule
voltage divider rule

... Voltage Divider Rule • The voltage divider rule states that the voltage across a resistor in a series circuit is equal to the value of that resistor times the total impressed voltage across the series elements divided by the total resistance of the ...
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... In the application the HS nodes are clamped by the body diode of the external lower N-MOSFET, therefore the HS node will generally not exceed –1V. However, in some applications, board resistance and inductance may result in the HS node exceeding this stated voltage transiently. If negative transient ...
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... ohm, C  2.2 µF (recommended parameters are: R = 100 ± 2 ohm, C = 1.0 ± 0.2 µF). One of the allowed terminations may be integrated in the Associated Apparatus. This Field Device is also equipped with an integrated terminator; see note 5. FISCO limits the number of passive devices connected to a sing ...
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Lecture13: LC & LCR Circuits, EM Oscillations

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resisTors 101

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... Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absol ...
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Test probe



A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to a device under test (DUT). They range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
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