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Single-Cell Li-Ion Charge Management IC for PDAs and Internet
Single-Cell Li-Ion Charge Management IC for PDAs and Internet

... current to the battery. An external sense-resistor sets the magnitude of the current. The constant-current phase is maintained until the battery reaches the charge-regulation voltage. The bq2400x then transitions to the constant voltage phase. The user can configure the device for cells with either ...
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... output headroom requirement is complemented by a similar 1.2V input stage headroom giving exceptional capability for single +5V operation. The OPA684’s low 1.7mA supply current is precisely trimmed at 25°C. This trim, along with low shift over temperature and supply voltage, gives a very robust desi ...
AN-4162 — Switch Node Ring Control in Synchronous Buck
AN-4162 — Switch Node Ring Control in Synchronous Buck

... nanoseconds, so the voltage probe should have a minimum bandwidth of 500 MHz. The circuit should be probed as close as possible to the terminals of the low-side MOSFET in the MCM package. In the FAN23xx MCM, the reference of the probe should be on PGND pins 18-21 and the probe tip should be on the S ...
Low-Noise, Low Quiescent Current, Precision Operational Amplifier e-trim™ OPA376
Low-Noise, Low Quiescent Current, Precision Operational Amplifier e-trim™ OPA376

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www.Jameco.com 1-800-831-4242 Jameco Part Number 115318

... offset and drift of the OP07 with both high speed and low noise. Offsets down to 25 µV and drift of 0.6 µV/°C maximum make the OP27 ideal for precision instrumentation applications. Exceptionally low noise, en = 3.5 nV/√Hz, at 10 Hz, a low 1/f noise corner frequency of 2.7 Hz, and high gain (1.8 mil ...
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AD797 Ultralow Distortion, Ultralow Noise Op Amp Data Sheet

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TS3DDR3812 数据资料 dataSheet 下载

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... Note 3: When used in dual-supply systems where the regulator load is returned to a negative supply, the output voltage must be diode-clamped to ground. Note 4: May exceed the input supply voltage. Note 5: Output or reference voltage temperature coefficient is defined as the worst case voltage change ...
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TPS60140 数据资料 dataSheet 下载

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... Optimizing the power factor of units operating off of AC lines is becoming more and more important. There are a number of reasons for this. There are a growing number of government regulations requiring Power Factor Correction PFC. Many of these are originating in Europe. Regulations such as IEC1000 ...
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... Two buffered limiting voltages take control of the output when it attempts to drive beyond these limits. This new output limiting architecture holds the limiter offset error to ±15 mV. The op amp operates linearly to within 30 mV of the output limit voltages. The combination of narrow nonlinear rang ...
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TPS62110-Q1 17-V 1.5-A Synchronous Step

Y. Han, O. Leitermann, D. Jackson, J.M. Rivas, and D.J. Perreault, “Resistance Compression Networks for Resonant Power Conversion,” 2005 IEEE Power Electronics Specialists Conference , June 2005, pp. 1282-1292.
Y. Han, O. Leitermann, D. Jackson, J.M. Rivas, and D.J. Perreault, “Resistance Compression Networks for Resonant Power Conversion,” 2005 IEEE Power Electronics Specialists Conference , June 2005, pp. 1282-1292.

EE-253: Power Bypass Decoupling of SHARC Processors
EE-253: Power Bypass Decoupling of SHARC Processors

... microfarads of capacitance to allow for the slow voltage supply regulator response time, so it can’t be that 13.96 nF is not enough. Note that there is no term in Equation 5 for the actual charge/discharge time. The equation is merely a ratio of charges based upon total capacitance and voltage chang ...
Dual, Variable Gain Amplifier
Dual, Variable Gain Amplifier

lecture1423726156
lecture1423726156

... · A diode and capacitor can be combined to “clamp” an AC signal to a specific DC level. · It must have a capacitor, a diode and a resistive element. · For additional shift an independent DC supply can be introduced in the circuit. · The time constant τ=RC must be large enough to ensure that the volt ...
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Test probe



A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to a device under test (DUT). They range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
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