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AD13280 Dual-Channel, 12-Bit, 80 MSPS ADC with Analog Input Signal
AD13280 Dual-Channel, 12-Bit, 80 MSPS ADC with Analog Input Signal

Alexander
Alexander

... • Amplitude and phase difference are two principal concerns in the study of voltage and current sinusoids. • Phasor will be defined from the cosine function in all our proceeding study. If a voltage or current expression is in the form of a sine, it will be changed to a cosine by subtracting from th ...
Alexander
Alexander

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Low Resistance Measurement
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... then the voltage drop across them will result in insufficient voltage across the DUT (Device Under Test) to make a sensible reading. Cropico ohmmeters check this compliance voltage across the DUT and prevent a measurement from being made if it falls too low. A warning display is also provided; preve ...
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... Note 2: Input pins (+IN, –IN, VOCM, SHDN and VTIP) are protected by steering diodes to either supply. If the inputs should exceed either supply voltage, the input current should be limited to less than 10mA. In addition, the inputs +IN, –IN are protected by a pair of back-to-back diodes. If the diff ...
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... The front-end stage of conventional offline converters, typically consisting of a full-wave rectifier bridge with a capacitor filter, has an unregulated DC bus from the AC mains. The filter capacitor must be large enough to have a relatively low ripple superimposed on the DC level. This means that t ...
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MAX16930/MAX16931 2MHz, 36V, Dual Buck with Preboost and 20µA Quiescent Current General Description
MAX16930/MAX16931 2MHz, 36V, Dual Buck with Preboost and 20µA Quiescent Current General Description

... The devices are intended for applications with mid- to high-power requirements that operate at a wide input voltage range such as during automotive cold-crank or engine stop-start conditions. The MAX16930/MAX16931 step-down controllers operate 180N out-of-phase at frequencies up to 2.2MHz to allow s ...
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Test probe



A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to a device under test (DUT). They range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
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