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UT54ACS169 - Aeroflex Microelectronic Solutions
UT54ACS169 - Aeroflex Microelectronic Solutions

... 1.Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, 50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified r ...
Load range extension methods for lightning impulse testing with
Load range extension methods for lightning impulse testing with

TVS short pulse dynamic resistance measurement and correlation
TVS short pulse dynamic resistance measurement and correlation

... A commonly used method to probe the dynamic characteristic of a TVS is the TLP (transmission line pulse). This uses square pulses with a duration between 75 ns to 200 ns with fast rise times of few nanoseconds. The equipment required is specific and expensive and is dedicated to the characterization ...
LM2662 Switch cap inverter-doubler.pdf
LM2662 Switch cap inverter-doubler.pdf

AD831 Low Distortion Mixer Data Sheet (REV. C)
AD831 Low Distortion Mixer Data Sheet (REV. C)

... frequency. The input circuit can be modeled as a resistance in parallel with a capacitance. The 82 pF capacitors (CF ) connected from IFN and IFP to VP provide a low-pass filter with a cutoff frequency of approximately 140 MHz in down-conversion applications (see the Theory of Operation section for ...
Catalog 3.5
Catalog 3.5

... The Murrelektronik analog coupler converds standard signal formats (0…10 V, ± 0…20 mA, 4…20 mA) galvanically isolated into these signals. Due to an integrated current limiter on the output, the autput is short ciruit and overload protected. A special characteristic of the MULTIWANDLER Art.-No. 66442 ...
The transistor we will be using for this lab is BFR92A, a
The transistor we will be using for this lab is BFR92A, a

... approach known as negative-resistance oscillator (NRO) method. Please refer to the lecture slides of ME1000 for detailed theoretical treatment on this subject. Here we will split the transistor oscillator circuit into a destabilized amplifier and a resonator portion, as shown in Figure 1. We need to ...
sp-152 instruction manual
sp-152 instruction manual

... which the voltage is to be measured. When measuring DC voltage the black lead should be connected to the more negative point of measurement. When measuring AC voltage the polarity does not matter. 5. To read DC voltage use the black “DC” arc directly below the mirrored arc. Use the numbers whose ful ...
Superposition
Superposition

... result, due only to the one active source in the circuit. 4. Return to the original circuit. Choose a different source to remain active and de-activate all of the others. 5. Solve again for the desired quantity, which will be a second partial result. 6. Continue in this manner, working sequentially ...
Very Low Distortion, Precision Difference Amplifier AD8274
Very Low Distortion, Precision Difference Amplifier AD8274

... 6 kΩ Resistor to Noninverting Terminal of Op Amp. Used as reference pin in G = ½ configuration. Used as positive input in G = 2 configuration. 12 kΩ Resistor to Inverting Terminal of Op Amp. Used as negative input in G = ½ configuration. Connect to output in G = 2 configuration. 12 kΩ Resistor to No ...
rectifier, transformer and filter design
rectifier, transformer and filter design

... reflected vaIue. The g u e s s for E,, ,will also give a rough first idea of the rectifier secondary turns. From t h i s a secondary contribution to R, may be calculated using a wire size appropriate for % of I, (for the full-wave case). If the E,, t h u s calculated is too far from the guess on ...
Capacitors File
Capacitors File

Electrical Formulas
Electrical Formulas

... At some distance from the terminals, depending upon wire size, the L-N fault current is lower than the L-L fault current. The 1.5 multiplier is an approximation and will theoretically vary from 1.33 to 1.67. These figures are based on change in turns ratio between primary and secondary, infinite sou ...
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VMP-300

... electronic stability while making high speed measurements. The floating mode (with earth isolated power supply) allows experiments to be run on grounded cells, on pipelines or autoclaves. An exclusive feature of the VMP-300 is the on-board operating system. Control of the experiment is provided by t ...
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Pre-Lab: Electric Fields
Pre-Lab: Electric Fields

... Choose the best answer. (10 points total) A galvanometer can be used as an ammeter or a voltmeter by combining it with an external resistor in a specific way. In the lab manual, Ig and r are called the galvanometer characteristics. 1. Which variable does the lab manual use to denote the internal res ...
Using Ohm`s Law to Build a Voltage Divider
Using Ohm`s Law to Build a Voltage Divider

Nodal and Loop Analysis
Nodal and Loop Analysis

... Loop analysis is a special application of KVL on a circuit. We use a special kind of loop called a 'mesh' which is a loop that does not have any other loops inside of it. A mesh starts at a node and traces a path around a circuit, returning to the original node without hitting any nodes more than on ...
BIPOLAR JUNCTION TRANSISTORS BIPOLAR JUNCTION
BIPOLAR JUNCTION TRANSISTORS BIPOLAR JUNCTION

... Let the base current swing be ±10 µA, then ...
Unit 11 PowerPoint Slides
Unit 11 PowerPoint Slides

... We often need to find the sum of two or more sinusoids. A unique mathematical property of sinusoids: the sum of sinusoids of the same frequency is always another sinusoid of that frequency. You can’t make the same statement for triangle waves, square waves, sawtooth waves, or other waveshapes. ...
AN4075
AN4075

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Class I, II, and III Dielectric Capacitor Codes

... starting up of current across an inductor. The starting up of current across a capacitor is similar to the starting up of voltage across an inductor. ...
LM3915 Dot/Bar Display Driver
LM3915 Dot/Bar Display Driver

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Lab 40 ELECTRICAL TRANSFORMERS

... Friday, April 18, 2014 ...
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Test probe



A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to a device under test (DUT). They range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
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