Variability-Aware Static Latch Modeling Center for Embedded Computer Systems
Variability and Reliability Analysis of Carbon Nanotube Technology in the Imperfections
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Validity of Constant Voltage Stress Based Reliability Assessment of
Valerio Re - FEE 2006 Workshop
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V GS - Purdue Physics
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V DS - Weber State University
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Utilizing Reverse Short Channel Effect for Optimal Subthreshold
Utilizing Low-Threshold Voltages for Increased Battery Life
UT8R128K32 - Aeroflex Microelectronic Solutions
UT54BS3245 - Aeroflex Microelectronic Solutions
UT54BS16210 20-bit Bus Switch - Aeroflex Microelectronic Solutions
Using the STVM100 to fully auto adjust LCD flicker
Using the NANOSATC-BR1 to evaluate the effects of space radiation
Using Standard Power-Over-Ethernet
